Modeling of Degradation Effects on the High Frequency Noise of Metal–Oxide–Semiconductor Field-Effect Transistors

2005 ◽  
Vol 44 (1A) ◽  
pp. 38-43 ◽  
Author(s):  
Heng-Fa Teng ◽  
S.-L. Jang ◽  
M.-H. Juang
2007 ◽  
Vol 101 (12) ◽  
pp. 124501 ◽  
Author(s):  
Reza Navid ◽  
Christoph Jungemann ◽  
Thomas H. Lee ◽  
Robert W. Dutton

2008 ◽  
Vol 104 (9) ◽  
pp. 094505 ◽  
Author(s):  
S. L. Rumyantsev ◽  
M. S. Shur ◽  
M. E. Levinshtein ◽  
P. A. Ivanov ◽  
J. W. Palmour ◽  
...  

2011 ◽  
Vol 50 (4) ◽  
pp. 04DC01 ◽  
Author(s):  
Philippe Gaubert ◽  
Akinobu Teramoto ◽  
Rihito Kuroda ◽  
Yukihisa Nakao ◽  
Hiroaki Tanaka ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document