The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

2009 ◽  
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pp. 123502 ◽  
Author(s):  
Jaeseob Lee ◽  
Jin-Seong Park ◽  
Young Shin Pyo ◽  
Dong Bum Lee ◽  
Eun Hyun Kim ◽  
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2008 ◽  
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pp. 123508 ◽  
Author(s):  
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Hui Won Yang ◽  
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Author(s):  
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In-Tak Cho ◽  
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2011 ◽  
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pp. 104-106 ◽  
Author(s):  
Seung Min Lee ◽  
Chang Il Ryoo ◽  
Jae Wook Park ◽  
Joonsoo Han ◽  
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2015 ◽  
Vol 135 (6) ◽  
pp. 192-198 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
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