Deposition and electrical properties ofinsituphosphorus‐doped silicon films formed by low‐pressure chemical vapor deposition
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2000 ◽
Vol 18
(5)
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pp. 2389
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2005 ◽
Vol 8
(1-3)
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pp. 125-129
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2005 ◽
Vol 8
(1-3)
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pp. 121-124
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1994 ◽
Vol 37-38
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pp. 305-310
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