The influence of bias power levels on mark length variability in rare earth–transition metal optical data storage media

1990 ◽  
Vol 68 (7) ◽  
pp. 3769-3771 ◽  
Author(s):  
Brian J. Bartholomeusz ◽  
David J. Genova ◽  
Tukaram K. Hatwar
1995 ◽  
Vol 397 ◽  
Author(s):  
R. Martin Villarica ◽  
Fazio Nash ◽  
J. Chaiken ◽  
Joe Osman ◽  
Rebecca Bussjager

ABSTRACTWe describe a novel laser chemical process having potential for optical data storage and processing applications. Reversible oxygen exchange involving WO3, using readily available laser sources offers improved durability and versatility over existing erasable optical data storage media. Being interconvertable using heat and blue-green laser sources, the well known yellow WO3 and blue W2O5 can function as erased and written states.


2006 ◽  
Vol 18 (S1) ◽  
pp. 38-44
Author(s):  
Bernhard Cord ◽  
Michael Mücke ◽  
Eggo Sichmann

Author(s):  
Mingliang Pan ◽  
Yi Zhong ◽  
Hui Lin ◽  
Hongran Bao ◽  
Lulu Zheng ◽  
...  

Persistent luminescence phosphors are regarded as one of the promising candidates for optical storage media. However, most optical storages using phosphors can only realize single-bit-data recording, limiting the storage capacity....


1989 ◽  
Vol 66 (10) ◽  
pp. 4635-4639 ◽  
Author(s):  
B. Bartholomeusz ◽  
P. Bowers ◽  
D. Genova

1988 ◽  
Vol 128 ◽  
Author(s):  
Kenneth D. Cornett ◽  
Ursula J. Gibson ◽  
Anthony Taylor

ABSTRACTRare-Earth Transition-Metal alloys such as Tb-Fe-Co are being studied and used as magneto-optic data storage materials. These materials are susceptible to oxidation by either oxygen or water vapor, particularly the rare earth component. Pitting corrosion is also a problem when protective overlayers have pinholes or a porous microstructure. Both degradation mechanisms are significant for application of this material to optical data storage. We have used ion assisted deposition (IAD) to produce protective overlayers of refractory oxides, such as Al2O2 and ZrO2. These layers were deposited both with and without IAD onto iron films and exposed to environments with controlled temperature and humidity. A scanning micro-reflectometer capable of detecting micrometer-sized pinholes was used to monitor the degradation of the iron layer with exposure time.


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