Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide
Keyword(s):
AbstractElectrical characterization of CaCu3Ti4O12 (CCTO) ceramics with scanning probe based techniques has been carried out. In particular, conductive atomic force microscopy (C-AFM) and scanning impedance microscopy (SIM) have been used to demonstrate the presence, shape and size in CCTO ceramics of the different electrically domains, both at the grain boundaries and within the grains. The electrical characteristics of single grains and of single domains have been evaluated and it has been observed that the conductive grains are surrounded by insulating grain boundaries.
2015 ◽
Vol 70
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pp. 373-378
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2010 ◽
Vol 30
(7)
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pp. 1761-1764
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Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy
2008 ◽
Vol 112
(49)
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pp. 19680-19685
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2006 ◽
Vol 243
(1)
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pp. 16-19
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2002 ◽
Vol 389-393
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pp. 667-670
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2010 ◽
Vol 25
(2)
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pp. 213-218
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