Crystallographic anisotropy in thin film magnetic recording media analyzed with x‐ray diffraction

1993 ◽  
Vol 73 (11) ◽  
pp. 7591-7598 ◽  
Author(s):  
H. Kataoka ◽  
J. A. Bain ◽  
S. Brennan ◽  
B. M. Clemens
1992 ◽  
Vol 36 ◽  
pp. 197-202
Author(s):  
Po-Wen Wang

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.


1987 ◽  
Vol 23 (5) ◽  
pp. 3645-3647 ◽  
Author(s):  
V. Novotny ◽  
G. Itnyre ◽  
A. Homola ◽  
L. Franco

1989 ◽  
Vol 13 (S_1_PMRC_89) ◽  
pp. S1_773-777 ◽  
Author(s):  
Takashi TOMIE ◽  
Ikuto SUGIYAMA ◽  
Kimio KINOSHITA ◽  
Hisashi HAMANO ◽  
Isuke OUCHI

1996 ◽  
Vol 79 (8) ◽  
pp. 5342 ◽  
Author(s):  
C. A. Ross ◽  
M. E. Schabes ◽  
R. Ranjan ◽  
G. Bertero ◽  
T. Chen

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