Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

1993 ◽  
pp. 197-202
Author(s):  
Po-Wen Wang
Keyword(s):  
Structural Characterization ◽  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
X Ray Diffraction ◽  
X Ray

Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

1992 ◽  
Vol 36 ◽  
pp. 197-202
Author(s):  
Po-Wen Wang
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Depth Resolution ◽  
Grazing Incidence ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Relationship

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled

scholarly journals Characterization of Nanostructured Magnetic Recording Media

2003 ◽  
Vol 9 (S02) ◽  
pp. 482-489 ◽  
Author(s):  
J.E. Wittig ◽  
J.F. Al-Sharab ◽  
J. Bentley ◽  
N.D. Evans
Keyword(s):  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media
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