Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

1992 ◽  
Vol 36 ◽  
pp. 197-202
Author(s):  
Po-Wen Wang
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Depth Resolution ◽  
Grazing Incidence ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Relationship

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.

scholarly journals Green synthesis and characterization of hexaferrite strontium-perovskite strontium photocatalyst nanocomposites

2020 ◽  
Vol 43 (1) ◽  
pp. 26-42 ◽  
Author(s):  
Zahra Hajian Karahroudi ◽  
Kambiz Hedayati ◽  
Mojtaba Goodarzi
Keyword(s):  
Magnetic Properties ◽  
Green Synthesis ◽  
Sol Gel ◽  
Synthesis Method ◽  
Combustion Method ◽  
Lemon Juice ◽  
X Ray Diffraction ◽  
X Ray ◽  
Auto Combustion

AbstractThis study presents a preparation of SrFe12O19– SrTiO3 nanocomposite synthesis via the green auto-combustion method. At first, SrFe12O19 nanoparticles were synthesized as a core and then, SrTiO3 nanoparticles were prepared as a shell for it to manufacture SrFe12O19–SrTiO3 nanocomposite. A novel sol-gel auto-combustion green synthesis method has been used with lemon juice as a capping agent. The prepared SrFe12O19–SrTiO3 nanocomposites were characterized by using several techniques to characterize their structural, morphological and magnetic properties. The crystal structures of the nanocomposite were investigated via X-ray diffraction (XRD). The morphology of SrFe12O19– SrTiO3 nanocomposite was studied by using a scanning electron microscope (SEM). The elemental composition of the materials was analyzed by an energy-dispersive X-ray (EDX). Magnetic properties and hysteresis loop of nanopowder were characterized via vibrating sample magnetometer (VSM) in the room temperature. Fourier transform infrared spectroscopy (FTIR) spectra of the samples showed the molecular bands of nanoparticles. Also, the photocatalytic behavior of nanocomposites has been checked by the degradation of azo dyes under irradiation of ultraviolet light.

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Synthesis and Characterization of the First 1:2 Ordered Perovskite Ruthenate

2002 ◽  
Vol 718 ◽  
Author(s):  
Job Rijssenbeek ◽  
Sylvie Malo ◽  
Takashi Saito ◽  
Vincent Caignaert ◽  
Masaki Azuma ◽  
...  
Keyword(s):  
Magnetic Properties ◽  
Neutron Diffraction ◽  
Structure Type ◽  
Synthesis And Characterization ◽  
Neutron Diffraction Data ◽  
X Ray ◽  
Relationship Of ◽  
The Relationship ◽  
Perovskite Lattice

AbstractPerovskite-like mixed metal ruthenates are of interest owing to their varied electronic and magnetic properties, which are heavily dependent on the ordering of the transition metals. We report the synthesis and structural characterization of the first 1:2 ordered perovskite ruthenate, Sr3CaRu2O9. The structure was determined from a combination of powder X-ray, electron and neutron diffraction data and is characterized by a 1:2 ordering of Ca2+ and Ru5+ over the sixcoordinate B-sites of the perovskite lattice. Sr3CaRu2O9 is the first example of this structure-type to include a majority metal with d electrons (Ru(V), d3). The relationship of this material to the K2NiF4-type Sr1.5Ca0.5RuO4 (i.e., Sr3CaRu2O8) highlights the dramatic effects of the ruthenium valence on the resultant structure. Remarkably, these two structures can be quantitatively interconverted by the appropriate choice of reaction temperature and atmosphere.

Energy Dispersive Grazing Incidence X-ray Diffraction Study on Organic Thin Films EpitaxiaHy Grown on Crystalline Substrate

1995 ◽  
Vol 39 ◽  
pp. 659-664 ◽  
Author(s):  
Kenji Ishida ◽  
Akinori Kita ◽  
Kouichi Hayashi ◽  
Toshihisa Horiuchi ◽  
Shoichi Kal ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Film Studies ◽  
Organic Thin Films ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Evaluation ◽  
Crystalline Substrate ◽  
Scattering Volume

Thin film technology is rapidly evolving today, and the characterization of the thin film and its surface have become very important issue not only from scientific but also technological viewpoints. Although x-ray diffraction measurements have been used as suitable evaluation methods in crystallography studies, its application to the structural evaluation of the thin films, especially organic one having the low electron densities, is not easy due to the small amounts of scattering volume and the high obstructive scattering noise from the substrate. However, the x-ray diffraction measurements under grazing incidence will aid not only in overcoming the such problems but also in analyzing in-plane structure of the thin films. Therefore, so-called grazing incidence x-ray diffraction (GIXD) has been recognized as one of the most powerful tools for the surface and thin film studies.

Progress in study of mono- and multilayers and thin film structure by X-ray reflectivity, grazing incidence X-ray diffraction and spectroscopy

2014 ◽  
Vol 83 (12) ◽  
Author(s):  
M A Shcherbina ◽  
S N Chvalun ◽  
Sergey Anatol'evich Ponomarenko ◽  
Mikhail Valentinovich Kovalchuk
Keyword(s):  
Thin Film ◽  
Grazing Incidence ◽  
Film Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Structure
Sign in / Sign up

Export Citation Format

Share Document