Characterization of trapping states in polycrystalline‐silicon thin film transistors by deep level transient spectroscopy

1993 ◽  
Vol 74 (3) ◽  
pp. 1787-1792 ◽  
Author(s):  
J. R. Ayres
Keyword(s):  
Thin Film ◽  
Deep Level Transient Spectroscopy ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Deep Level ◽  
Silicon Thin Film ◽  
Transient Spectroscopy

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

2001 ◽  
Vol 80-81 ◽  
pp. 367-372
Author(s):  
F.V. Farmakis ◽  
D.M. Tsamados ◽  
J. Brini ◽  
G. Kamarinos ◽  
C.A. Dimitriadis
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Noise Characterization

Electrical characterization of polycrystalline silicon thin film transistors crystallized by a new alignment sequential lateral solidification process

2011 ◽  
Vol 83 (5) ◽  
pp. 055802
Author(s):  
Sang-Jin Lee ◽  
Seok-Woo Lee ◽  
Kyung-Eon Lee ◽  
Myoung-Su Yang ◽  
Woo-Sup Shin ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Electrical Characterization ◽  
Solidification Process ◽  
Silicon Thin Film ◽  
Sequential Lateral Solidification

Characterization of Polycrystalline Silicon Thin-Film Transistors with Nickel-Titanium Oxide Gate Dielectric Coating by Sol-Gel Method

2009 ◽  
Author(s):  
S. C. Wu ◽  
R. C. Yen ◽  
C. K. Deng ◽  
T. S. Chao ◽  
S. H. Chuang ◽  
...  
Keyword(s):  
Thin Film ◽  
Titanium Oxide ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Dielectric ◽  
Sol Gel ◽  
Nickel Titanium ◽  
Silicon Thin Film ◽  
Gel Method

Fabrication and characterization of low temperature polycrystalline silicon thin film transistors by ink-jet printed nickel-mediated lateral crystallization

2009 ◽  
Vol 94 (12) ◽  
pp. 122105 ◽  
Author(s):  
Jang-Sik Lee ◽  
Min-Sun Kim ◽  
Dongjo Kim ◽  
Yong-Mu Kim ◽  
Jooho Moon ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Ink Jet ◽  
Fabrication And Characterization ◽  
Lateral Crystallization

Characterization of Polycrystalline Silicon Thin-Film Transistors

2006 ◽  
Vol 45 (3A) ◽  
pp. 1534-1539 ◽  
Author(s):  
Toshiyuki Sameshima ◽  
Mutsumi Kimura
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Characterization of Polycrystalline Silicon Thin Film Transistors Fabricated by Ultrahigh-Vacuum Chemical Vapor Deposition and Chemical Mechanical Polishing

1997 ◽  
Vol 36 (Part 1, No. 7A) ◽  
pp. 4278-4282 ◽  
Author(s):  
Hsiao-Yi Lin ◽  
Chun-Yen Chang ◽  
Tan Fu Lei ◽  
Juing-Yi Cheng ◽  
Hua-Chou Tseng ◽  
...  
Keyword(s):  
Thin Film ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Mechanical Polishing ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Ultrahigh Vacuum ◽  
Chemical Vapor ◽  
Silicon Thin Film

Characterization of DC-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2014 ◽  
Vol 61 (9) ◽  
pp. 3206-3212 ◽  
Author(s):  
Meng Zhang ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
Hoi-Sing Kwok
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Dc Stress
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