Characterization of Polycrystalline Silicon Thin Film Transistors Fabricated by Ultrahigh-Vacuum Chemical Vapor Deposition and Chemical Mechanical Polishing
1997 ◽
Vol 36
(Part 1, No. 7A)
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pp. 4278-4282
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1995 ◽
1991 ◽
2001 ◽
Vol 395
(1-2)
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pp. 330-334
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2014 ◽
Vol 33
(3-4)
◽
pp. 149-154
◽
2007 ◽
Vol 46
(No. 49)
◽
pp. L1228-L1230
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