Characterization of Switching Transient Behaviors in Polycrystalline-Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.477 ◽

2004 ◽

Vol 43 (2) ◽

pp. 477-484 ◽

Author(s):

Hiroyuki Ikeda

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.80-81.367 ◽

2001 ◽

Vol 80-81 ◽

pp. 367-372

Author(s):

F.V. Farmakis ◽

D.M. Tsamados ◽

J. Brini ◽

G. Kamarinos ◽

C.A. Dimitriadis

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Noise Characterization

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Characterization of Low-Frequency Noise in Polycrystalline Silicon Thin-Film Transistors under Different Temperature

2021 9th International Symposium on Next Generation Electronics (ISNE) ◽

10.1109/isne48910.2021.9493595 ◽

2021 ◽

Author(s):

Yuyang Yang ◽

Meng Zhang ◽

Yuhuang Zeng ◽

Zhihe Xia ◽

Letong Qian ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Silicon Thin Film

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Electrical characterization of polycrystalline silicon thin film transistors crystallized by a new alignment sequential lateral solidification process

Physica Scripta ◽

10.1088/0031-8949/83/05/055802 ◽

2011 ◽

Vol 83 (5) ◽

pp. 055802

Author(s):

Sang-Jin Lee ◽

Seok-Woo Lee ◽

Kyung-Eon Lee ◽

Myoung-Su Yang ◽

Woo-Sup Shin ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Electrical Characterization ◽

Solidification Process ◽

Silicon Thin Film ◽

Sequential Lateral Solidification

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Characterization of Polycrystalline Silicon Thin-Film Transistors with Nickel-Titanium Oxide Gate Dielectric Coating by Sol-Gel Method

10.7567/ssdm.2009.p-9-2 ◽

2009 ◽

Author(s):

S. C. Wu ◽

R. C. Yen ◽

C. K. Deng ◽

T. S. Chao ◽

S. H. Chuang ◽

...

Keyword(s):

Thin Film ◽

Titanium Oxide ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Gate Dielectric ◽

Sol Gel ◽

Nickel Titanium ◽

Silicon Thin Film ◽

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Fabrication and characterization of low temperature polycrystalline silicon thin film transistors by ink-jet printed nickel-mediated lateral crystallization

Applied Physics Letters ◽

10.1063/1.3105983 ◽

2009 ◽

Vol 94 (12) ◽

pp. 122105 ◽

Author(s):

Jang-Sik Lee ◽

Min-Sun Kim ◽

Dongjo Kim ◽

Yong-Mu Kim ◽

Jooho Moon ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Ink Jet ◽

Fabrication And Characterization ◽

Lateral Crystallization

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Characterization of Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.1534 ◽

2006 ◽

Vol 45 (3A) ◽

pp. 1534-1539 ◽

Author(s):

Toshiyuki Sameshima ◽

Mutsumi Kimura

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Characterization of Polycrystalline Silicon Thin Film Transistors Fabricated by Ultrahigh-Vacuum Chemical Vapor Deposition and Chemical Mechanical Polishing

Japanese Journal of Applied Physics ◽

10.1143/jjap.36.4278 ◽

1997 ◽

Vol 36 (Part 1, No. 7A) ◽

pp. 4278-4282 ◽

Author(s):

Hsiao-Yi Lin ◽

Chun-Yen Chang ◽

Tan Fu Lei ◽

Juing-Yi Cheng ◽

Hua-Chou Tseng ◽

...

Keyword(s):

Thin Film ◽

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Chemical Mechanical Polishing ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Ultrahigh Vacuum ◽

Chemical Vapor ◽

Silicon Thin Film

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Characterization of DC-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2014.2341676 ◽

2014 ◽

Vol 61 (9) ◽

pp. 3206-3212 ◽

Author(s):

Meng Zhang ◽

Wei Zhou ◽

Rongsheng Chen ◽

Man Wong ◽

Hoi-Sing Kwok

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

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$\hbox{1}/f$ Noise Characterization of n- and p-Type Polycrystalline-Silicon Thin-Film Transistors

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2009.2023080 ◽

2009 ◽

Vol 9 (3) ◽

pp. 372-378 ◽

Author(s):

D.T. Story ◽

M. Behravan

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

P Type ◽

Noise Characterization

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Characterization of trapping states in polycrystalline‐silicon thin film transistors by deep level transient spectroscopy

Journal of Applied Physics ◽

10.1063/1.354782 ◽

1993 ◽

Vol 74 (3) ◽

pp. 1787-1792 ◽

Author(s):

J. R. Ayres

Keyword(s):

Thin Film ◽

Deep Level Transient Spectroscopy ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Transient Spectroscopy

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