Fabrication and characterization of low temperature polycrystalline silicon thin film transistors by ink-jet printed nickel-mediated lateral crystallization

2009 ◽  
Vol 94 (12) ◽  
pp. 122105 ◽  
Author(s):  
Jang-Sik Lee ◽  
Min-Sun Kim ◽  
Dongjo Kim ◽  
Yong-Mu Kim ◽  
Jooho Moon ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Ink Jet ◽  
Fabrication And Characterization ◽  
Lateral Crystallization

Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide

2007 ◽  
Vol 46 (7A) ◽  
pp. 4021-4027 ◽  
Author(s):  
Hitoshi Ueno ◽  
Yuta Sugawara ◽  
Hiroshi Yano ◽  
Tomoaki Hatayama ◽  
Yukiharu Uraoka ◽  
...  
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Gate Oxide ◽  
Silicon Thin Film

Electrical and Noise Characterization of Large-Grain Polycrystalline Silicon Thin-Film Transistors

2001 ◽  
Vol 80-81 ◽  
pp. 367-372
Author(s):  
F.V. Farmakis ◽  
D.M. Tsamados ◽  
J. Brini ◽  
G. Kamarinos ◽  
C.A. Dimitriadis
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Noise Characterization
Sign in / Sign up

Export Citation Format

Share Document