Lattice relaxation and three‐dimensional reflection high‐energy electron‐diffraction analysis of strained epitaxial Co/Mn superlattices

1994 ◽  
Vol 76 (5) ◽  
pp. 2817-2824 ◽  
Author(s):  
Y. Henry ◽  
V. Pierron‐Bohnes ◽  
P. Vennégues ◽  
K. Ounadjela
1989 ◽  
Vol 148 ◽  
Author(s):  
Kazushi Miki ◽  
Kunihiro Sakamoto ◽  
Tsunenori Sakamoto

ABSTRACTWe report the dynamic RHEED (reflection high energy electron diffraction) observation during Ge/Si(001) heteroepitaxy at various growth temperatures. The RHEED intensityanalysis and the in-plane lattice constant analysis reveal a growth fashion and lattice relaxation. Both of them depend strongly on growth temperature.


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