Time-resolved reflection high energy electron diffraction analysis for atomic layer depositions of GaSb by molecular beam epitaxy
1996 ◽
Vol 35
(Part 1, No. 10)
◽
pp. 5255-5260
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1995 ◽
Vol 146
(1-4)
◽
pp. 344-348
◽
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
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Keyword(s):
1996 ◽
Vol 35
(Part 2, No. 3B)
◽
pp. L366-L369
◽