Phase and composition depth distribution analyses of low energy, high flux N implanted stainless steel

1995 ◽  
Vol 77 (8) ◽  
pp. 3839-3850 ◽  
Author(s):  
Orhan Öztürk ◽  
D. L. Williamson
Keyword(s):  
Stainless Steel ◽  
Depth Distribution ◽  
Low Energy ◽  
High Flux

Influence of low energy–high flux nitrogen implantation on the oxidation behavior of AISI 304L austenitic stainless steel

2003 ◽  
Vol 94 (12) ◽  
pp. 7509 ◽  
Author(s):  
F. Pedraza ◽  
J. L. Grosseau-Poussard ◽  
G. Abrasonis ◽  
J. P. Rivière ◽  
J. F. Dinhut
Keyword(s):  
Stainless Steel ◽  
Austenitic Stainless Steel ◽  
Oxidation Behavior ◽  
Low Energy ◽  
High Flux ◽  
Nitrogen Implantation ◽  
Aisi 304L

Helium self-trapping and diffusion behaviors in deformed 316L stainless steel exposed to high flux and low energy helium plasma

2018 ◽  
Vol 58 (4) ◽  
pp. 046011 ◽  
Author(s):  
Yihao Gong ◽  
Shuoxue Jin ◽  
Te Zhu ◽  
Long Cheng ◽  
Xingzhong Cao ◽  
...  
Keyword(s):  
Stainless Steel ◽  
316L Stainless Steel ◽  
Low Energy ◽  
Helium Plasma ◽  
High Flux ◽  
Self Trapping ◽  
And Diffusion ◽  
Diffusion Behaviors

Evaluation of the uncertainty associated with sample holders in NAA measurements in LAN/IPEN

2019 ◽  
Vol 7 (2A) ◽  
Author(s):  
Guilherme Soares Zahn ◽  
Regina Beck Ticianelli ◽  
Mitiko Saiki ◽  
Frederico Antonio Genezini
Keyword(s):  
Stainless Steel ◽  
Neutron Activation Analysis ◽  
Neutron Activation ◽  
Gamma Rays ◽  
Experimental Error ◽  
Steel Sample ◽  
Low Energy ◽  
Stainless Steel Sample ◽  
Gamma Emission ◽  
Energy Gamma

In IPEN’s Neutron Activation Laboratory (LAN/IPEN), thin stainless steel sample holders are used for gamma spectrometry in NAA measurements. This material is very practical, but its chemical composition may be troublesome, as it presents large amounts of elements with intermediate atomic number, with attenuation factors for low-energy gamma-rays that must not be neglected. In this study, count rates obtained using different sample holders were compared. To accomplish that, an Am-241 source, with 59-keV gamma emission, was used so that low-energy gamma attenuation differences can be determined. Moreover, in order to study the energy dependence of these differences, a Ho-166m source was also used. From these results, it was possible to analyze the experimental error associated to the variations between sample holders, with the aim of introducing an addictive term to the uncertainty analysis of comparative Neutron Activation Analysis results.

scholarly journals Fluence Dependence of Surface Morphology and Deuterium Retention in W Bulks and Nanocrystalline W Films Exposed to Deuterium Plasma

2021 ◽  
Vol 11 (4) ◽  
pp. 1619
Author(s):  
Jing Yan ◽  
Xia Li ◽  
Kaigui Zhu
Keyword(s):  
Surface Morphology ◽  
Thermal Desorption Spectroscopy ◽  
Low Energy ◽  
High Flux ◽  
Deuterium Plasma ◽  
Vacancy Clusters ◽  
Plasma Irradiation ◽  
Deuterium Retention ◽  
Fluence Dependence ◽  
Scanning Electron

The surface morphology of pure W bulks and nanocrystalline tungsten films was investigated after exposure to a low-energy (100 eV/D), high-flux (1.8 × 1021 D·m−2s−1) deuterium plasma. Nanocrystalline tungsten films of 6 μm thickness were deposited on tungsten bulks and exposed to deuterium plasma at various fluences ranging from 1.30 × 1025 to 5.18 × 1025 D·m−2. Changes in surface morphology from before to after irradiation were studied with scanning electron microscopy (SEM). The W bulk exposed to low-fluence plasma (1.30 × 1025 D·m−2) shows blisters. The blisters on the W bulk irradiated to higher-fluence plasma are much larger (~2 µm). The blisters on the surface of W films are smaller in size and lower in density than those of the W bulks. In addition, the modifications exhibit the appearance of cracks below the surface after deuterium plasma irradiation. It is suggested that the blisters are caused by the diffusion and aggregation of the deuterium-vacancy clusters. The deuterium retention of the W bulks and nanocrystalline tungsten films was studied using thermal desorption spectroscopy (TDS). The retention of deuterium in W bulks and W films increases with increasing deuterium plasma fluence when irradiated at 500 K.

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