Tribochemical wear of single crystal aluminum in NaCl solution studied by atomic force microscopy

2011 ◽  
Vol 110 (6) ◽  
pp. 063509 ◽  
Author(s):  
M. Cai ◽  
S. C. Langford ◽  
J. T. Dickinson
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Nacl Solution ◽  
Force Microscopy ◽  
Atomic Force

Surface observations of synthetic hydroxyapatite single crystal by atomic force microscopy

1995 ◽  
Vol 148 (1-2) ◽  
pp. 201-206 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Synthetic Hydroxyapatite ◽  
Surface Observations

scholarly journals Nanoscale corrosion behavior of polycrystalline copper fine wires in dilute NaCl solution investigated by in-situ atomic force microscopy

2016 ◽  
Vol 105 ◽  
pp. 177-182 ◽  
Author(s):  
Shoichiro Ogata ◽  
Naritaka Kobayashi ◽  
Takuya Kitagawa ◽  
Shohei Shima ◽  
Akira Fukunaga ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Corrosion Behavior ◽  
Polycrystalline Copper ◽  
Nacl Solution ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy of C60/C70 single-crystal fullerenes under ethanol

1993 ◽  
Vol 56 (3) ◽  
pp. 207-210 ◽  
Author(s):  
P. Dietz ◽  
P. Hansma ◽  
K. Fostiropoulos ◽  
W. Kr�tschmer
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Force Microscopy ◽  
Atomic Force

Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy

2009 ◽  
Vol 106 (5) ◽  
pp. 054301 ◽  
Author(s):  
E. Tranvouez ◽  
E. Boer-Duchemin ◽  
A. J. Mayne ◽  
T. Vanderbruggen ◽  
M. Scheele ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Diamond Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Crystal Diamond

Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy

2015 ◽  
Vol 17 (10) ◽  
pp. 6794-6800 ◽  
Author(s):  
Yasuyuki Yokota ◽  
Hisaya Hara ◽  
Yusuke Morino ◽  
Ken-ichi Bando ◽  
Akihito Imanishi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Single Crystal ◽  
Frequency Modulation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clean Interface ◽  
Crystal Interfaces

Frequency modulation atomic force microscopy was employed to show a molecularly clean interface between an ionic liquid and a rubrene single crystal for possible applications to electric double-layer field-effect transistors.

XANES AND ATOMIC FORCE MICROSCOPY STUDIES ON PRE- AND POST-IRRADIATED SAPPHIRE

2008 ◽  
Vol 22 (30) ◽  
pp. 3007-3013 ◽  
Author(s):  
D. M. BHARDWAJ ◽  
D. C. JAIN ◽  
RAVI KUMAR ◽  
R. P. GUPTA ◽  
K. B. GARG
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
South African ◽  
Structural Changes ◽  
Force Microscopy ◽  
Atomic Force Microscopy Technique ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Sapphire Single Crystal ◽  
Edge Features

XANES measurements at the Fe - K edge on natural South African sapphire single crystal (corundum) and an irradiated sample with fluence 1 × 1012 Ni 6+ ions/cm 2 are reported. Some decrease in intensity of pre-edge features (1s → 3d) and increase in intensity of 1s → 4p transition in Fe is observed with Ni fluence. Structural changes and modification on surface of irradiated sapphire with Ni 6+ ion have been observed by the atomic force microscopy technique and discussed in the term of defects.

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