Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy

1998 ◽  
Vol 84 (5) ◽  
pp. 2546-2550 ◽  
Author(s):  
S. Senz ◽  
U. Egger ◽  
M. Schultz ◽  
U. Gösele ◽  
H. Ito
Keyword(s):  
High Resolution ◽  
Mass Spectroscopy ◽  
X Ray Diffraction ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

scholarly journals Comparison of nitrogen compositions in the as-grown GaNxAs1−x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

2002 ◽  
Vol 80 (22) ◽  
pp. 4136-4138 ◽  
Author(s):  
W. J. Fan ◽  
S. F. Yoon ◽  
T. K. Ng ◽  
S. Z. Wang ◽  
W. K. Loke ◽  
...  
Keyword(s):  
High Resolution ◽  
Mass Spectroscopy ◽  
X Ray Diffraction ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

scholarly journals Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 295-298 ◽  
Author(s):  
Wen Biao YING ◽  
Yusuke MIZOKAWA ◽  
Yoshitomo KAMIURA ◽  
Yong Bing YU ◽  
Masafumi NISHIMATSU ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Surfaces ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Doped Silicon ◽  
Phosphorus Doped ◽  
Secondary Ion

Composition Analysis of High-Stable Transparent Conductive Zinc Oxide by X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy

2011 ◽  
Vol 50 (12R) ◽  
pp. 121101 ◽  
Author(s):  
Takashi Kuchiyama ◽  
Shigehiko Hasegawa ◽  
Kenji Yamamoto ◽  
Yuden Teraoka ◽  
Hajime Asahi
Keyword(s):  
Zinc Oxide ◽  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Composition Analysis ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

Study of Asphaltene Adsorption on Kaolinite by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

2013 ◽  
Vol 27 (5) ◽  
pp. 2465-2473 ◽  
Author(s):  
Shanshan Wang ◽  
Qi Liu ◽  
Xiaoli Tan ◽  
Chunming Xu ◽  
Murray R. Gray
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

Studies of Ion-Selective Solvent Polymeric Membranes by X-ray Photoelectron Spectroscopy and Time-of-Flight Static Secondary Ion Mass Spectroscopy

1998 ◽  
Vol 70 (20) ◽  
pp. 4241-4246 ◽  
Author(s):  
Qingshan Ye ◽  
George Horvai ◽  
András Tóth ◽  
Imre Bertóti ◽  
Marc Botreau ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
Polymeric Membranes ◽  
Selective Solvent ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings

1998 ◽  
Vol 28 (10) ◽  
pp. 1464-1470 ◽  
Author(s):  
Ronald R Martin ◽  
T K Sham ◽  
G Wong Won ◽  
Paul van der Heide ◽  
Keith W Jones ◽  
...  
Keyword(s):  
Tree Rings ◽  
Mass Spectroscopy ◽  
Metal Content ◽  
Fluorescence Analysis ◽  
Ring System ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Qualitative Variation ◽  
Secondary Ion ◽  
Cu And Zn

Secondary ion mass spectroscopy and synchrotron X-ray fluorescence analysis have been used to document the changes in metal content across the ring system of trees from northern Canada. The results show a seasonal qualitative variation in the uptake of Na, Al, K, Ca, Cr, Mn, Fe, Cu, and Zn. Diffusional models show that locally elevated concentrations of selected metals are sufficiently stable within individual rings that variations in content among rings remain at detectable levels for at least a century.

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