Surface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy

Surface Structures ◽

Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy

Surface Science ◽

10.1016/j.susc.2012.07.013 ◽

2012 ◽

Vol 606 (21-22) ◽

pp. 1693-1699 ◽

Cited By ~ 25

Author(s):

Kaoru Nakajima ◽

Shinichi Oshima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Surface Structures

Surface Structures of Ionic Liquids Observed by High-resolution Rutherford Backscattering Spectroscopy

ECS Meeting Abstracts ◽

10.1149/ma2008-02/49/2971 ◽

2008 ◽

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Surface Structures

Stoichiometry and absolute atomic concentration profiles obtained by combined Rutherford backscattering spectroscopy and secondary-ion mass spectroscopy: InAs nanocrystals in Si

Nanotechnology ◽

10.1088/0957-4484/13/5/318 ◽

2002 ◽

Vol 13 (5) ◽

pp. 631-634 ◽

Cited By ~ 6

Author(s):

H Karl ◽

I Grosshans ◽

A Wenzel ◽

B Stritzker ◽

R Claessen ◽

...

Keyword(s):

Mass Spectroscopy ◽

Concentration Profiles ◽

Atomic Concentration ◽

Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

Review of Scientific Instruments ◽

10.1063/1.3541799 ◽

2011 ◽

Vol 82 (3) ◽

pp. 033101 ◽

Cited By ~ 9

Author(s):

K. Hirata ◽

Y. Saitoh ◽

A. Chiba ◽

K. Yamada ◽

Y. Takahashi ◽

...

Keyword(s):

Chemical Analysis ◽

Organic Compounds ◽

Mass Spectroscopy ◽

Impact Ionization ◽

Time Of Flight ◽

Cluster Ion ◽

Ion Impact ◽

Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy

Nuclear Materials and Energy ◽

10.1016/j.nme.2018.10.004 ◽

2018 ◽

Vol 17 ◽

pp. 147-151 ◽

Cited By ~ 3

Author(s):

M. Mayer ◽

T.F. Silva ◽

R. Arredondo ◽

M. Balden ◽

I. Bogdanović-Radović ◽

...

Keyword(s):

High Resolution ◽

Time Of Flight ◽

Model Systems ◽

Surface Enrichment ◽

Resolution Time ◽

Tungsten Surface

Quantitative Evaluation of Molecular Diffusion in Organic Planar Heterojunctions by Time-of-Flight Secondary Ion Mass Spectroscopy

ACS Omega ◽

10.1021/acsomega.7b01524 ◽

2018 ◽

Vol 3 (2) ◽

pp. 1522-1528 ◽

Cited By ~ 8

Author(s):

Kyohei Nakano ◽

Takahiro Shibamori ◽

Keisuke Tajima

Keyword(s):

Quantitative Evaluation ◽

Mass Spectroscopy ◽

Molecular Diffusion ◽

Time Of Flight ◽

Interdiffusion in GaAs(1-x)Sbx/GaAs superlattices studied with high-resolution x-ray diffraction and secondary ion mass spectroscopy

Journal of Applied Physics ◽

10.1063/1.368416 ◽

1998 ◽

Vol 84 (5) ◽

pp. 2546-2550 ◽

Cited By ~ 9

Author(s):

S. Senz ◽

U. Egger ◽

M. Schultz ◽

U. Gösele ◽

H. Ito

Keyword(s):

High Resolution ◽

Mass Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

10.1520/e2695 ◽

2009 ◽

Author(s):

Keyword(s):

Spectral Data ◽

Mass Spectroscopy ◽

Time Of Flight ◽

Mass Spectral Data ◽

Mass Spectral ◽

Comparison of nitrogen compositions in the as-grown GaNxAs1−x on GaAs measured by high-resolution x-ray diffraction and secondary-ion mass spectroscopy

Applied Physics Letters ◽

10.1063/1.1483913 ◽

2002 ◽

Vol 80 (22) ◽

pp. 4136-4138 ◽

Cited By ~ 63

Author(s):

W. J. Fan ◽

S. F. Yoon ◽

T. K. Ng ◽

S. Z. Wang ◽

W. K. Loke ◽

...

Keyword(s):

High Resolution ◽

Mass Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

An investigation of the wear track on DLC (a-C:H) film by time-of-flight secondary ion mass spectroscopy

Surface and Coatings Technology ◽

10.1016/s0257-8972(01)01422-0 ◽

2001 ◽

Vol 146-147 ◽

pp. 378-383 ◽

Cited By ~ 29

Author(s):

Haruyo Fukui ◽

Miki Irie ◽

Yoshiharu Utsumi ◽

Kazuhiko Oda ◽

Hisanori Ohara

Keyword(s):

Mass Spectroscopy ◽

Wear Track ◽

Time Of Flight ◽