Studies of Ion-Selective Solvent Polymeric Membranes by X-ray Photoelectron Spectroscopy and Time-of-Flight Static Secondary Ion Mass Spectroscopy

1998 ◽  
Vol 70 (20) ◽  
pp. 4241-4246 ◽  
Author(s):  
Qingshan Ye ◽  
George Horvai ◽  
András Tóth ◽  
Imre Bertóti ◽  
Marc Botreau ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
Polymeric Membranes ◽  
Selective Solvent ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

Study of Asphaltene Adsorption on Kaolinite by X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy

2013 ◽  
Vol 27 (5) ◽  
pp. 2465-2473 ◽  
Author(s):  
Shanshan Wang ◽  
Qi Liu ◽  
Xiaoli Tan ◽  
Chunming Xu ◽  
Murray R. Gray
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

scholarly journals Phosphorus Behavior in Heavily Phosphorus-Doped Silicon Surfaces due to Annealing. X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy.

Shinku ◽  
1995 ◽  
Vol 38 (3) ◽  
pp. 295-298 ◽  
Author(s):  
Wen Biao YING ◽  
Yusuke MIZOKAWA ◽  
Yoshitomo KAMIURA ◽  
Yong Bing YU ◽  
Masafumi NISHIMATSU ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Surfaces ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Doped Silicon ◽  
Phosphorus Doped ◽  
Secondary Ion

Composition Analysis of High-Stable Transparent Conductive Zinc Oxide by X-ray Photoelectron Spectroscopy and Secondary Ion Mass Spectroscopy

2011 ◽  
Vol 50 (12R) ◽  
pp. 121101 ◽  
Author(s):  
Takashi Kuchiyama ◽  
Shigehiko Hasegawa ◽  
Kenji Yamamoto ◽  
Yuden Teraoka ◽  
Hajime Asahi
Keyword(s):  
Zinc Oxide ◽  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Composition Analysis ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

X-ray photoelectron spectroscopy and static secondary ion mass spectroscopy study of activation mechanism of Zr–V low activation temperature nonevaporable getter films

2003 ◽  
Vol 21 (3) ◽  
pp. 797-805 ◽  
Author(s):  
Karel Mas̆ek ◽  
Frantis̆ek S̆utara ◽  
Tomás̆ Skála ◽  
Jir̆ı́ Drbohlav ◽  
Kater̆ina Veltruská ◽  
...  
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Activation Mechanism ◽  
Spectroscopy Study ◽  
Activation Temperature ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Secondary Ion

Incorporation of OH radicals in anodic silicon oxide films studied by secondary-ion mass spectroscopy, X-ray photoelectron spectroscopy and ir analysis

1990 ◽  
Vol 193-194 ◽  
pp. 325-332 ◽  
Author(s):  
I. Montero ◽  
L. Galán ◽  
E. de la Cal ◽  
J.M. Albella ◽  
J.C. Pivin
Keyword(s):  
Mass Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Oxide ◽  
Oxide Films ◽  
Oh Radicals ◽  
Secondary Ion Mass Spectroscopy ◽  
X Ray ◽  
Ir Analysis ◽  
Secondary Ion
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