Erratum: “Numerical study of the role of a background gas and system geometry in pulsed laser deposition” [J. Appl. Phys. 83, 6050 (1998)]

1998 ◽  
Vol 84 (9) ◽  
pp. 5372-5372
Author(s):  
T. E. Itina ◽  
A. A. Katassonov ◽  
W. Marine ◽  
M. Autric
1998 ◽  
Vol 83 (11) ◽  
pp. 6050-6054 ◽  
Author(s):  
T. E. Itina ◽  
A. A. Katassonov ◽  
W. Marine ◽  
M. Autric

2012 ◽  
Vol 110 (4) ◽  
pp. 863-867 ◽  
Author(s):  
R. Serna ◽  
M. Jiménez de Castro ◽  
J. Toudert ◽  
E. Haro-Poniatowski ◽  
J. García López

2007 ◽  
Vol 254 (4) ◽  
pp. 1228-1231 ◽  
Author(s):  
M.E. Koleva ◽  
P.A. Atanasov ◽  
N.N. Nedialkov ◽  
H. Fukuoka ◽  
M. Obara

2003 ◽  
Vol 94 (1) ◽  
pp. 594-597 ◽  
Author(s):  
L. Yan ◽  
L. B. Kong ◽  
J. S. Pan ◽  
C. K. Ong

2019 ◽  
Vol 196 ◽  
pp. 00008
Author(s):  
Sergey V. Starinskiy ◽  
Alexey A. Rodionov ◽  
Yuri G. Shukhov ◽  
Alexander V. Bulgakov

We have analysed changes in the oxidation state of SiOx films produced by pulsed laser deposition in a background gas with different partial pressures of oxygen. The optical properties of the films in IR range are shown to be close to those of SiO2 while the total oxidation degree is considerably less than 2. It is suggested that the film consists of oxidized and unoxidized regions due to preferential oxidation of the periphery of the silicon ablation plume during expansion. These regions are overlapping in the film if the laser beam is scanned on the target.


2000 ◽  
Vol 12 (10) ◽  
pp. 2858-2868 ◽  
Author(s):  
B. Mercey ◽  
J. Wolfman ◽  
W. Prellier ◽  
M. Hervieu ◽  
Ch. Simon ◽  
...  

1999 ◽  
Vol 75 (26) ◽  
pp. 4091-4093 ◽  
Author(s):  
Stefan G. Mayr ◽  
Michael Moske ◽  
Konrad Samwer ◽  
Maggie E. Taylor ◽  
Harry A. Atwater

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