Clustering distances critical to metal dimer formation in the secondary ion mass spectra (SIMS) of cesium chloride

1979 ◽  
Vol 70 (11) ◽  
pp. 4834-4836 ◽  
Author(s):  
Fumihiro Honda ◽  
Yasuo Fukuda ◽  
J. Wayne Rabalais
Keyword(s):  
Mass Spectra ◽  
Cesium Chloride ◽  
Dimer Formation ◽  
Secondary Ion

Liquid secondary ion mass spectra and fast atom bombardment mass spectra of diquaternary pyridinium oxime salts

1995 ◽  
Vol 30 (2) ◽  
pp. 282-289 ◽  
Author(s):  
Gary J. Kunkel ◽  
Kenneth L. Busch ◽  
Richard Dunphy ◽  
David J. Burinsky ◽  
Ruth Barak ◽  
...  
Keyword(s):  
Mass Spectra ◽  
Fast Atom Bombardment ◽  
Secondary Ion

Liquid secondary ion mass spectra of 2-iminothiolane derivatives

1994 ◽  
Vol 23 (6) ◽  
pp. 353-356 ◽  
Author(s):  
Michael G. Bartlett ◽  
Kenneth L. Busch
Keyword(s):  
Mass Spectra ◽  
Secondary Ion

Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper

1973 ◽  
Vol 18 (3-4) ◽  
pp. 269-273 ◽  
Author(s):  
H. W. Werner ◽  
H. A. M. De Grefte ◽  
J. Van Den Berg
Keyword(s):  
Copper Oxide ◽  
Mass Spectra ◽  
Depth Analysis ◽  
Secondary Ion

scholarly journals Новый подход к анализу фазового состава углеродсодержащих материалов методом времяпролетной вторично-ионной масс-спектрометрии

2019 ◽  
Vol 45 (2) ◽  
pp. 50
Author(s):  
М.Н. Дроздов ◽  
Ю.Н. Дроздов ◽  
А.И. Охапкин ◽  
С.А. Краев ◽  
М.А. Лобаев
Keyword(s):  
Mass Spectra ◽  
Secondary Ion Mass Spectrometry ◽  
Simple Algorithm ◽  
Cluster Ions ◽  
Two Phase ◽  
Depth Profiles ◽  
Secondary Cluster ◽  
Phase Systems ◽  
Secondary Ion

AbstractNew possibilities offered by the method of secondary ion mass spectrometry (SIMS) for analysis of the phase composition of carbon-containing materials are considered. Differences are established between the mass spectra of three carbon phases: diamond, diamond-like carbon (DLC), and graphite. A simple algorithm for the quantitative determination of different phases in two-phase systems diamond–graphite and DLC–graphite is proposed that is based on the measurement of relative intensities of secondary cluster ions such as C_8/C_5 and CsC_8/CsC_4. It is shown that nonuniform depth profiles of various carbon phases are formed in diamond structures upon laser cutting and in DLC structures upon thermal annealing.

scholarly journals Analysis of COSIMA spectra: Bayesian approach

2015 ◽  
Vol 4 (1) ◽  
pp. 139-148
Author(s):  
H. J. Lehto ◽  
B. Zaprudin ◽  
K. M. Lehto ◽  
T. Lönnberg ◽  
J. Silén ◽  
...  
Keyword(s):  
Mass Spectra ◽  
Joint Probability ◽  
Mass Analyzer ◽  
Mass Scaling ◽  
Tof Sims ◽  
Analysis Methods ◽  
Measured Line ◽  
Complex Forms ◽  
Joint Probability Density ◽  
Secondary Ion

Abstract. We describe the use of Bayesian analysis methods applied to time-of-flight secondary ion mass spectrometer (TOF-SIMS) spectra. The method is applied to the COmetary Secondary Ion Mass Analyzer (COSIMA) TOF-SIMS mass spectra where the analysis can be broken into subgroups of lines close to integer mass values. The effects of the instrumental dead time are discussed in a new way. The method finds the joint probability density functions of measured line parameters (number of lines, and their widths, peak amplitudes, integrated amplitudes and positions). In the case of two or more lines, these distributions can take complex forms. The derived line parameters can be used to further calibrate the mass scaling of TOF-SIMS and to feed the results into other analysis methods such as multivariate analyses of spectra. We intend to use the method, first as a comprehensive tool to perform quantitative analysis of spectra, and second as a fast tool for studying interesting targets for obtaining additional TOF-SIMS measurements of the sample, a property unique to COSIMA. Finally, we point out that the Bayesian method can be thought of as a means to solve inverse problems but with forward calculations, only with no iterative corrections or other manipulation of the observed data.

scholarly journals Imaging and Analytics on the Helium Ion Microscope

2019 ◽  
Vol 12 (1) ◽  
pp. 523-543 ◽  
Author(s):  
Tom Wirtz ◽  
Olivier De Castro ◽  
Jean-Nicolas Audinot ◽  
Patrick Philipp
Keyword(s):  
Mass Spectra ◽  
Secondary Electron ◽  
Secondary Ion Mass Spectrometry ◽  
Depth Of Field ◽  
3D Images ◽  
Helium Ion ◽  
Scanning Transmission ◽  
Electron Imaging ◽  
Secondary Ion ◽  
High Depth

The helium ion microscope (HIM) has emerged as an instrument of choice for patterning, imaging and, more recently, analytics at the nanoscale. Here, we review secondary electron imaging on the HIM and the various methodologies and hardware components that have been developed to confer analytical capabilities to the HIM. Secondary electron–based imaging can be performed at resolutions down to 0.5 nm with high contrast, with high depth of field, and directly on insulating samples. Analytical methods include secondary electron hyperspectral imaging (SEHI), scanning transmission ion microscopy (STIM), backscattering spectrometry and, in particular, secondary ion mass spectrometry (SIMS). The SIMS system that was specifically designed for the HIM allows the detection of all elements, the differentiation between isotopes, and the detection of trace elements. It provides mass spectra, depth profiles, and 2D or 3D images with lateral resolutions down to 10 nm.

Suppression of molecular ions in the secondary ion mass spectra of minerals

1983 ◽  
Vol 5 (5) ◽  
pp. 181-185 ◽  
Author(s):  
J. B. Metson ◽  
G. M. Bancroft ◽  
N. S. McIntyre ◽  
W. J. Chauvin
Keyword(s):  
Mass Spectra ◽  
Molecular Ions ◽  
Secondary Ion

Mass Spectrometric Behaviour of Carboxylated Polyethylene Glycols and Carboxylated Octylphenol Ethoxylates

2003 ◽  
Vol 9 (3) ◽  
pp. 165-173 ◽  
Author(s):  
Magdalena Frańska ◽  
Agnieszka Zgoła ◽  
Joanna Rychłowska ◽  
Andrzej Szymański ◽  
Zenon Łukaszewski ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Alkali Metal ◽  
Mass Spectra ◽  
Secondary Ion Mass Spectrometry ◽  
Metal Cations ◽  
Mass Spectrometric ◽  
Polyethylene Glycols ◽  
Alkali Metal Cations ◽  
Secondary Ion

The mass spectrometric behaviour of mono- and di-carboxylated polyethylene glycols (PEGCs and CPEGCs) and carboxylated octylphenol ethoxylates (OPECs) is discussed. The tendency for ionisation (deprotonation, protonation and cationisation by alkali–metal cations) of carboxylated PEGs was compared with that of non-carboxylated analogues by using both secondary-ion mass spectrometry (SIMS) and electrospray ionisation (ESI). The fragmentation of the PEGCs and CPEGCs is discussed and also compared with their neutral analogues, PEGs. B/E linked-scan mass spectra were recorded, using secondary-ion mass spectrometry as a method for ion generation, for deprotonated and protonated molecules as well as for molecules cationised by alkali–metal cations. The fragmentation behaviour of PEGs is found to be different from that of CPEGCs, The presence of carboxyl groups may be confirmed not only by the determination of molecular weights of the ethoxylates studied, but also on the basis of the fragment ions formed. The metastable decomposition of the [OPEC-H]− ions proceeds through the cleavage of the bond between the octylphenol moiety and the ethoxylene chain and leads to the octylphenoxyl anions. It permits determination of the mass of the hydrophobic moiety of the studied carboxylated alkylphenol ethoxylate. ESI mass spectra recorded in the negative-ion mode were found to be more suitable than SI mass spectra for the determination of the average molecular weight of carboxylated ethoxylates.

Sign in / Sign up

Export Citation Format

Share Document