X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

2013 ◽  
Vol 113 (6) ◽  
pp. 063511 ◽  
Author(s):  
C. Raisch ◽  
C. Langheinrich ◽  
R. Werner ◽  
R. Kleiner ◽  
D. Koelle ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray ◽  
Photoelectron Diffraction

Comprehensive X-Ray Diffraction Study of YBa$_{\bf 2}$Cu$_{\bf 3}$O$_{{\bf 7}-\ninmb{\delta}}$ Thin Films

1995 ◽  
Vol 34 (Part 1, No. 11) ◽  
pp. 6036-6040
Author(s):  
A. Z. Moshfegh ◽  
A. H. Fatollahi ◽  
Y. Q. Wang ◽  
Y. Y. Sun ◽  
P. H. Hor ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray

The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study

2010 ◽  
Vol 133 (21) ◽  
pp. 214701 ◽  
Author(s):  
Rong Rong Zhan ◽  
Erik Vesselli ◽  
Alessandro Baraldi ◽  
Silvano Lizzit ◽  
Giovanni Comelli
Keyword(s):  
Diffraction Study ◽  
Ultrathin Film ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rh Oxide

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

2005 ◽  
Vol 244 (1-4) ◽  
pp. 281-284 ◽  
Author(s):  
Naohiko Kato ◽  
Ichiro Konomi ◽  
Yoshiki Seno ◽  
Tomoyoshi Motohiro
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Diffraction Study ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
X Ray

In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

2013 ◽  
Vol 103 (24) ◽  
pp. 242904 ◽  
Author(s):  
J. Sinsheimer ◽  
S. J. Callori ◽  
B. Ziegler ◽  
B. Bein ◽  
P. V. Chinta ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Highly Strained
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