scholarly journals Study of gate oxide traps in HfO2/AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors by use of ac transconductance method

2013 ◽  
Vol 102 (10) ◽  
pp. 103504 ◽  
Author(s):  
X. Sun ◽  
O. I. Saadat ◽  
K. S. Chang-Liao ◽  
T. Palacios ◽  
S. Cui ◽  
...  
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