Photo-pseudo-metal–oxide–semiconductor field effect transistor for characterization of surface recombination in silicon on insulator materials
2004 ◽
Vol 22
(6)
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pp. 2691
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2003 ◽
Vol 20
(5)
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pp. 767-769
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2008 ◽
Vol 47
(11)
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pp. 8297-8304
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