Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy

APL Materials ◽

10.1063/1.4889815 ◽

2014 ◽

Vol 2 (9) ◽

pp. 092502 ◽

Author(s):

P. Sutter ◽

E. Sutter

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Boron Nitride ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Hexagonal Boron Nitride ◽

Boron Nitride Films ◽

Scanning Electron

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Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy

Journal of Applied Physics ◽

10.1063/1.357224 ◽

1994 ◽

Vol 76 (9) ◽

pp. 5118-5121 ◽

Author(s):

L. M. Do ◽

E. M. Han ◽

Y. Niidome ◽

M. Fujihira ◽

T. Kanno ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Organic Electroluminescence ◽

Force Microscopy ◽

Atomic Force ◽

Scanning Electron

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Investigation of orthodontic wires by scanning electron microscopy and Auger electron spectroscopy

Vacuum ◽

10.1016/0042-207x(92)90089-f ◽

1992 ◽

Vol 43 (5-7) ◽

pp. 613-615

Author(s):

Vladimir Ciprus ◽

Joze Pirs ◽

Loreta Pomenić ◽

Marija Kern ◽

Borut Praček

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Orthodontic Wires ◽

Scanning Electron

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Surface study of ferroelectric domains on G. A. S. H. single crystals by scanning electron microscopy and Auger electron spectroscopy

Ferroelectrics ◽

10.1080/00150198008008185 ◽

1980 ◽

Vol 26 (1) ◽

pp. 843-846 ◽

Author(s):

R. Le Bihan ◽

G. Jouet

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Single Crystals ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Study ◽

Ferroelectric Domains ◽

Scanning Electron

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Study of surface and domain structure of pure and doped BaTi03crystals by Auger electron spectroscopy and scanning electron microscopy

Ferroelectrics ◽

10.1080/00150198008008186 ◽

1980 ◽

Vol 26 (1) ◽

pp. 847-850 ◽

Author(s):

M. Maussion ◽

R. Le Bihan

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Domain Structure ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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Correlating auger electron spectroscopy with scanning electron microscopy-energy dispersive spectroscopy for the analysis of respirable particles

Scanning ◽

10.1002/sca.1998.4950200403 ◽

2006 ◽

Vol 20 (4) ◽

pp. 302-310 ◽

Author(s):

James W. Stephens ◽

Joel C. Harrison ◽

William E. Wallace

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Energy Dispersive Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Energy Dispersive ◽

Respirable Particles ◽

Scanning Electron

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Observations of Y-Ba-Cu-O Films by Scanning Electron Microscopy and Auger Electron Spectroscopy

Advances in Superconductivity ◽

10.1007/978-4-431-68084-0_106 ◽

1989 ◽

pp. 627-631

Author(s):

Kengo Ishiyama ◽

Yasuyuki Kageyama ◽

Yasunori Taga

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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Auger electron spectroscopy, transmission electron microscopy, and scanning electron microscopy studies of Nb/Al/Nb Josephson junction structures

Journal of Applied Physics ◽

10.1063/1.338334 ◽

1987 ◽

Vol 61 (11) ◽

pp. 5089-5097 ◽

Author(s):

Chuan C. Chang ◽

M. Gurvitch ◽

D. M. Hwang ◽

C. W. Blonder

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Transmission Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Josephson Junction ◽

Electron Spectroscopy ◽

Auger Electron ◽

Transmission Electron ◽

Scanning Electron

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Electron beam effects in Auger electron spectroscopy and scanning electron microscopy

Surface and Interface Analysis ◽

10.1002/sia.740010606 ◽

1979 ◽

Vol 1 (6) ◽

pp. 196-203 ◽

Author(s):

J. M. Fontaine ◽

J. P. Duraud ◽

C. Le Gressus

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Beam ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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Combined Auger electron spectroscopy and scanning electron microscopy

Journal of Physics E Scientific Instruments ◽

10.1088/0022-3735/6/5/011 ◽

1973 ◽

Vol 6 (5) ◽

pp. 435-438 ◽

Author(s):

G W B Ashwell ◽

C J Todd ◽

R Heckingbottom

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPY: POTENTIAL MEASUREMENTS

Applied Physics Letters ◽

10.1063/1.1653107 ◽

1970 ◽

Vol 16 (2) ◽

pp. 76-80 ◽

Author(s):

N. C. MacDonald

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Scanning Electron

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