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Combined Auger electron spectroscopy and scanning electron microscopy
Journal of Physics E Scientific Instruments
◽
10.1088/0022-3735/6/5/011
◽
1973
◽
Vol 6
(5)
◽
pp. 435-438
◽
Cited By ~ 12
Author(s):
G W B Ashwell
◽
C J Todd
◽
R Heckingbottom
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Scanning Electron
Download Full-text
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References
Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy
Journal of Applied Physics
◽
10.1063/1.357224
◽
1994
◽
Vol 76
(9)
◽
pp. 5118-5121
◽
Cited By ~ 131
Author(s):
L. M. Do
◽
E. M. Han
◽
Y. Niidome
◽
M. Fujihira
◽
T. Kanno
◽
...
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Atomic Force Microscopy
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Organic Electroluminescence
◽
Force Microscopy
◽
Atomic Force
◽
Scanning Electron
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Investigation of orthodontic wires by scanning electron microscopy and Auger electron spectroscopy
Vacuum
◽
10.1016/0042-207x(92)90089-f
◽
1992
◽
Vol 43
(5-7)
◽
pp. 613-615
Author(s):
Vladimir Ciprus
◽
Joze Pirs
◽
Loreta Pomenić
◽
Marija Kern
◽
Borut Praček
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Orthodontic Wires
◽
Scanning Electron
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Surface study of ferroelectric domains on G. A. S. H. single crystals by scanning electron microscopy and Auger electron spectroscopy
Ferroelectrics
◽
10.1080/00150198008008185
◽
1980
◽
Vol 26
(1)
◽
pp. 843-846
◽
Cited By ~ 15
Author(s):
R. Le Bihan
◽
G. Jouet
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Single Crystals
◽
Electron Spectroscopy
◽
Auger Electron
◽
Surface Study
◽
Ferroelectric Domains
◽
Scanning Electron
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Study of surface and domain structure of pure and doped BaTi03crystals by Auger electron spectroscopy and scanning electron microscopy
Ferroelectrics
◽
10.1080/00150198008008186
◽
1980
◽
Vol 26
(1)
◽
pp. 847-850
◽
Cited By ~ 5
Author(s):
M. Maussion
◽
R. Le Bihan
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Domain Structure
◽
Electron Spectroscopy
◽
Auger Electron
◽
Scanning Electron
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Correlating auger electron spectroscopy with scanning electron microscopy-energy dispersive spectroscopy for the analysis of respirable particles
Scanning
◽
10.1002/sca.1998.4950200403
◽
2006
◽
Vol 20
(4)
◽
pp. 302-310
◽
Cited By ~ 5
Author(s):
James W. Stephens
◽
Joel C. Harrison
◽
William E. Wallace
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Energy Dispersive Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Energy Dispersive
◽
Respirable Particles
◽
Scanning Electron
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Observations of Y-Ba-Cu-O Films by Scanning Electron Microscopy and Auger Electron Spectroscopy
Advances in Superconductivity
◽
10.1007/978-4-431-68084-0_106
◽
1989
◽
pp. 627-631
Author(s):
Kengo Ishiyama
◽
Yasuyuki Kageyama
◽
Yasunori Taga
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Scanning Electron
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Auger electron spectroscopy, transmission electron microscopy, and scanning electron microscopy studies of Nb/Al/Nb Josephson junction structures
Journal of Applied Physics
◽
10.1063/1.338334
◽
1987
◽
Vol 61
(11)
◽
pp. 5089-5097
◽
Cited By ~ 14
Author(s):
Chuan C. Chang
◽
M. Gurvitch
◽
D. M. Hwang
◽
C. W. Blonder
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Transmission Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Josephson Junction
◽
Electron Spectroscopy
◽
Auger Electron
◽
Transmission Electron
◽
Scanning Electron
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Electron beam effects in Auger electron spectroscopy and scanning electron microscopy
Surface and Interface Analysis
◽
10.1002/sia.740010606
◽
1979
◽
Vol 1
(6)
◽
pp. 196-203
◽
Cited By ~ 17
Author(s):
J. M. Fontaine
◽
J. P. Duraud
◽
C. Le Gressus
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Electron Beam
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Scanning Electron
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Thickness determination of few-layer hexagonal boron nitride films by scanning electron microscopy and Auger electron spectroscopy
APL Materials
◽
10.1063/1.4889815
◽
2014
◽
Vol 2
(9)
◽
pp. 092502
◽
Cited By ~ 15
Author(s):
P. Sutter
◽
E. Sutter
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Boron Nitride
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Hexagonal Boron Nitride
◽
Boron Nitride Films
◽
Scanning Electron
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AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPY: POTENTIAL MEASUREMENTS
Applied Physics Letters
◽
10.1063/1.1653107
◽
1970
◽
Vol 16
(2)
◽
pp. 76-80
◽
Cited By ~ 61
Author(s):
N. C. MacDonald
Keyword(s):
Electron Microscopy
◽
Scanning Electron Microscopy
◽
Auger Electron Spectroscopy
◽
Electron Spectroscopy
◽
Auger Electron
◽
Scanning Electron
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