scholarly journals Nano silver-catalyzed chemical etching of polycrystalline silicon wafer for solar cell application

AIP Advances ◽  
2016 ◽  
Vol 6 (3) ◽  
pp. 035320 ◽  
Author(s):  
S. R. Chen ◽  
Z. C. Liang ◽  
D. L. Wang
2018 ◽  
Vol 5 (11) ◽  
pp. 23258-23267
Author(s):  
Prashant Singh ◽  
Sanjay K. Srivastava ◽  
Vijay Prajapati ◽  
B. Sivaiah ◽  
C.M.S. Rauthan ◽  
...  

2014 ◽  
Vol 548-549 ◽  
pp. 48-52 ◽  
Author(s):  
Han Wang ◽  
Rui Miao ◽  
Xiao Song Wu ◽  
Wang Yuan Ni ◽  
Xu Chen Tang

As non-uniform color and complex texture exist on the polycrystalline silicon solar cell, manual surface inspection adopted by most domestic factories suffers from low efficiency and poor repetitive detection ability. To overcome the shortcomings of manual inspection, based on machine vision and SVM, an automatic silicon wafer surface defect detection and classification system has been developed in this paper: through feature extraction of color images and defect areas, a series of wafer classifiers are trained and used to separate the defective products from qualified ones. Experiments on samples and actual application in the enterprise show that the system has achieved high accuracy and fast run-time performance, indicating that machine vision is an effective and promising method for polycrystalline silicon solar cell inspection.


2018 ◽  
Vol 5 (3) ◽  
pp. 035905 ◽  
Author(s):  
AshkanVakilipour Takaloo ◽  
Mohammadreza Kolahdouz ◽  
Jafar Poursafar ◽  
Firat Es ◽  
Rasit Turan ◽  
...  

2002 ◽  
Vol 42 (15) ◽  
pp. 1657-1664 ◽  
Author(s):  
J Qian ◽  
S Steegen ◽  
E Vander Poorten ◽  
D Reynaerts ◽  
H Van Brussel

2017 ◽  
Vol 124 ◽  
pp. 158-170 ◽  
Author(s):  
Kamlesh Joshi ◽  
A. Ananya ◽  
Upendra Bhandarkar ◽  
Suhas S. Joshi

2018 ◽  
Author(s):  
Pei-Ying Lin ◽  
Ming-Hsien Li ◽  
Yu-Hsien Chiang ◽  
Po-Shen Shen ◽  
Peter Chen

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