Fabrication of thermal-resistant gratings for high-temperature measurements using geometric phase analysis

2016 ◽  
Vol 87 (12) ◽  
pp. 123104 ◽  
Author(s):  
Q. Zhang ◽  
Z. Liu ◽  
H. Xie ◽  
K. Ma ◽  
L. Wu
2012 ◽  
Vol 17 (4) ◽  
pp. 379-384 ◽  
Author(s):  
Krzysztof Strzecha ◽  
Tomasz Koszmider ◽  
Damian Zarębski ◽  
Wojciech Łobodziński

Abstract In this paper, a case-study of the auto-focus algorithm for correcting image distortions caused by gas flow in high-temperature measurements of surface phenomena is presented. This article shows results of proposed algorithm and methods for increasing its accuracy.


Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.


2008 ◽  
Vol 41 (3) ◽  
pp. 035408 ◽  
Author(s):  
J Kioseoglou ◽  
G P Dimitrakopulos ◽  
Ph Komninou ◽  
Th Karakostas ◽  
E C Aifantis

2007 ◽  
Vol 71 (5) ◽  
pp. 608-610 ◽  
Author(s):  
M. V. Gedgagova ◽  
Kh. M. Guketlov ◽  
V. K. Kumykov ◽  
A. R. Manukyants ◽  
I. N. Sergeev ◽  
...  

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