Simultaneous measurements of thin film thickness using total internal reflection fluorescence microscopy and disjoining pressure using Scheludko cell

2019 ◽  
Vol 90 (4) ◽  
pp. 045118 ◽  
Author(s):  
Tengxiao Ma ◽  
Leping Zhou ◽  
Xiaoze Du ◽  
Yongping Yang
Keyword(s):  
Thin Film ◽  
Fluorescence Microscopy ◽  
Film Thickness ◽  
Total Internal Reflection ◽  
Disjoining Pressure ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence ◽  
Thin Film Thickness ◽  
Simultaneous Measurements

scholarly journals Fast high-resolution 3D total internal reflection fluorescence microscopy by incidence angle scanning and azimuthal averaging

2014 ◽  
Vol 111 (48) ◽  
pp. 17164-17169 ◽  
Author(s):  
Jérôme Boulanger ◽  
Charles Gueudry ◽  
Daniel Münch ◽  
Bertrand Cinquin ◽  
Perrine Paul-Gilloteaux ◽  
...  
Keyword(s):  
High Resolution ◽  
Fluorescence Microscopy ◽  
Total Internal Reflection ◽  
Incidence Angle ◽  
Internal Reflection ◽  
Total Internal Reflection Fluorescence
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