Physical properties of group 14 semiconductor alloys in orthorhombic phase

2019 ◽  
Vol 126 (4) ◽  
pp. 045709 ◽  
Author(s):  
Qingyang Fan ◽  
Jie Xu ◽  
Wenzhu Zhang ◽  
Yanxing Song ◽  
Sining Yun
Keyword(s):  
Physical Properties ◽  
Orthorhombic Phase ◽  
Semiconductor Alloys ◽  
Group 14

Effect of Ta2O5 Addition on the Electrical and Physical Properties of Lead-Free 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3 Piezoelectric Ceramics

2011 ◽  
Vol 130-134 ◽  
pp. 883-886
Author(s):  
Chun Huy Wang
Keyword(s):  
Physical Properties ◽  
Piezoelectric Ceramic ◽  
Electromechanical Coupling ◽  
Orthorhombic Phase ◽  
Lead Free ◽  
Coupling Coefficients ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thickness Mode ◽  
Planar Mode

In this paper, the effects of Ta2O5addition on the electrical and physical properties of 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3were investigated. The 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3[0.98NKN-0.02NBT] ceramics with the addition of 0~0.5 wt% Ta2O5have been prepared following the conventional mixed oxide process. X-ray diffraction analysis revealed that, during sintering, all of the (Na0.5Bi0.5)TiO3diffuse into the lattice of (Na0.5K0.5)NbO3to form a solid solution, in which a orthorhombic phase with a perovskite structure was found. For 0.98NKN-0.02NBT ceramics by doping 0.1 wt% Ta2O5, the poled dielectric constant (K33T) is 1090. The electromechanical coupling coefficients of the planar modekpand the thickness modektreach 0.39 and 0.48, respectively. Our results show that 0.98NKN-0.02NBT with the addition of 0.1 wt% Ta2O5is a good lead-free piezoelectric ceramic.

scholarly journals Role of substrate temperature on the growth mechanism and physical properties of spray deposited lead oxide thin films

2014 ◽  
Vol 32 (3) ◽  
pp. 448-456 ◽  
Author(s):  
M. Suganya ◽  
A. Balu ◽  
K. Usharani
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Physical Properties ◽  
Growth Mechanism ◽  
Lead Oxide ◽  
Spray Pyrolysis Technique ◽  
Orthorhombic Phase ◽  
Cost Effective ◽  
Glass Substrates ◽  
Substrate Temperatures

AbstractThin films of lead oxide were synthesized by cost effective spray pyrolysis technique at different substrate temperatures on glass substrates. Effect of substrate temperature on the growth mechanism and physical properties of the films was investigated. All the films were polycrystalline in nature with tetragonal structure corresponding to α-PbO. The films coated at 225 °C and 275 °C were (1 0 1) oriented, while the films deposited at 325 °C and 375 °C were (0 0 2) oriented. Above 375 °C, the pure tetragonal nature deteriorated and the peaks corresponding to orthorhombic phase were observed. The band gap value was found to be in the range of 2.3 to 2.62 eV. All the films had a resistivity of the order of 103 ohm-cm. A minimum resistivity of 0.0191 × 103 ohm-cm was obtained for the film coated at 325 °C. The activation energy increased with increase in substrate temperature.

Computational investigations of mechanical and vibrational properties of quaternary semiconductor alloys MgxZn1-xSySe1-y

2015 ◽  
Vol 29 (19) ◽  
pp. 1550132 ◽  
Author(s):  
A. R. Jivani ◽  
A. R. Jani
Keyword(s):  
Physical Properties ◽  
Elastic Constants ◽  
Theoretical Work ◽  
Ternary Alloys ◽  
Semiconductor Alloys ◽  
Quaternary Alloys ◽  
Pressure Derivative ◽  
Wave Velocities ◽  
First Time ◽  
Physical Quantities

Physical properties like elastic constants, pressure derivative of bulk modulus, pressure derivative of elastic constants and acoustic wave velocities in different directions for Mg x Zn 1-x S , Mg x Zn 1-x Se and ZnS y Se 1-y semiconductor ternary alloys and Mg x Zn 1-x S y Se 1-y quaternary alloys with different concentrations of x and y are studied using our previously proposed potential based on the pseudopotential formalism. It is noticed from the present study that the physical properties under investigations depend on concentrations x and y of constitute compounds. The present results of various physical quantities of compounds presented here are compared with the available experimental data and other theoretical estimations and showed roughly reasonable agreement. The numerical values of same quantities for ternary alloys and MgZnSSe quaternary alloys were reported first time and hence such results may be useful for comparison purpose in future with either the experimental or the theoretical work.

Effect of Nb2O5 Addition on the Electrical and Physical Properties of Lead-Free 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3 Piezoelectric Ceramics

2011 ◽  
Vol 687 ◽  
pp. 269-274
Author(s):  
Chun Huy Wang
Keyword(s):  
Physical Properties ◽  
Piezoelectric Ceramic ◽  
Electromechanical Coupling ◽  
Orthorhombic Phase ◽  
Lead Free ◽  
Coupling Coefficients ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thickness Mode ◽  
Planar Mode

In this paper, the effects of Nb2O5addition on the electrical and physical properties of 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3were investigated. The 0.98(Na0.5K0.5)NbO3-0.02(Na0.5Bi0.5)TiO3[0.98NKN-0.02NBT] ceramics with the addition of 0~1.5 wt% Nb2O5have been prepared following the conventional mixed oxide process. X-ray diffraction analysis revealed that, during sintering, all of the (Na0.5Bi0.5)TiO3diffuse into the lattice of (Na0.5K0.5)NbO3to form a solid solution, in which an orthorhombic phase with a perovskite structure was found. For 0.98NKN-0.02NBT ceramics by doping 0.3 wt% Nb2O5, the poled dielectric constant (K33T) is 1180. The electromechanical coupling coefficients of the planar modekpand the thickness modektreach 0.43 and 0.52, respectively. Our results show that 0.98NKN-0.02NBT with the addition of 0.3 wt% Nb2O5is a good lead-free piezoelectric ceramic.

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