Direct observation of charge accumulation in quantum well solar cells by cross-sectional Kelvin probe force microscopy

Charge Accumulation ◽

Kelvin Probe ◽

Cross Sectional ◽

Cross-sectional Analysis of Surface Potential inside Solar Cells Using Kelvin Probe Force Microscopy

10.29363/nanoge.abxpvperopto.2018.038 ◽

2017 ◽

Author(s):

Shrabani Panigrahi ◽

Santanu Jana ◽

Tomás Calmeiro ◽

Daniela Nunes ◽

Rodrigo Martins ◽

...

Keyword(s):

Solar Cells ◽

Surface Potential ◽

Kelvin Probe ◽

Cross Sectional ◽

Force Microscopy ◽

Cross Sectional Analysis ◽

Sectional Analysis

Cross-sectional Kelvin probe force microscopy on Cu(In,Ga)Se2 solar cells: Influence of RbF and KF post-deposition treatment on the surface potential of the absorber layer

Applied Physics Letters ◽

10.1063/5.0032371 ◽

2020 ◽

Vol 117 (24) ◽

pp. 243901

Author(s):

Jasmin Seeger ◽

Florian Wilhelmi ◽

Jonas Schundelmeier ◽

Setareh Zahedi-Azad ◽

Roland Scheer ◽

...

Keyword(s):

Solar Cells ◽

Surface Potential ◽

Absorber Layer ◽

Kelvin Probe ◽

Cross Sectional ◽

Force Microscopy ◽

Post Deposition

Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

Grain boundary passivation by CdCl2 treatment in CdTe solar cells revealed by Kelvin probe force microscopy

Journal of Materials Science Materials in Electronics ◽

10.1007/s10854-018-0212-9 ◽

2018 ◽

Vol 29 (24) ◽

pp. 20718-20725 ◽

Cited By ~ 4

Author(s):

Chuang Li ◽

Gang Chen ◽

Wenwu Wang ◽

Jingquan Zhang ◽

Lili Wu ◽

...

Keyword(s):

Solar Cells ◽

Grain Boundary ◽

Kelvin Probe ◽

Force Microscopy ◽

Cdte Solar Cells ◽

Cdcl2 Treatment

Comments on “Nanoscale Investigation of Carrier Lifetime on the Cross Section of Epitaxial Silicon Solar Cells Using Kelvin Probe Force Microscopy”

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2018.2793760 ◽

2018 ◽

Vol 8 (2) ◽

pp. 661-663 ◽

Cited By ~ 1

Author(s):

Pablo A. Fernandez Garrillo ◽

Paul Narchi ◽

Pere Roca i Cabarrocas ◽

Benjamin Grevin ◽

Lukasz Borowik

Keyword(s):

Solar Cells ◽

Cross Section ◽

Carrier Lifetime ◽

Silicon Solar Cells ◽

Epitaxial Silicon ◽

Kelvin Probe ◽

Force Microscopy ◽

The Cross

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) ◽

Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells

10.1109/pvsc.2018.8547957 ◽

2018 ◽

Author(s):

Hyeondeuk Yong ◽

Takashi Minemoto ◽

Takuji Takahashi

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Force Microscopy ◽

Incident Photon

Photovoltage Decay Measurements by Photo-Assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells

IEEE Journal of Photovoltaics ◽

10.1109/jphotov.2018.2885835 ◽

2019 ◽

Vol 9 (2) ◽

pp. 483-491 ◽

Cited By ~ 1

Author(s):

Hyeondeuk Yong ◽

Takashi Minemoto ◽

Takuji Takahashi

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy

Nanoscale Research Letters ◽

10.1186/s11671-018-2639-6 ◽

2018 ◽

Vol 13 (1) ◽

Author(s):

Jongjin Lee ◽

Jaemin Kong

Keyword(s):

Organic Photovoltaics ◽

Kelvin Probe ◽

Cross Sectional ◽

Photovoltage decay processes in Cu(In, Ga)Se2 solar cells studied by photo-assisted Kelvin probe force microscopy

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) ◽

10.1109/pvsc.2013.6744422 ◽

2013 ◽

Author(s):

Hyeondeuk Yong ◽

Yu Nakajima ◽

Takashi Minemoto ◽

Takuji Takahashi

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Measurement of Cross-Sectional Potential of InAlAs/InGaAs Layered Structures in Vacuum by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.42.1751 ◽

2003 ◽

Vol 42 (Part 1, No. 4A) ◽

pp. 1751-1752 ◽

Cited By ~ 1

Author(s):

Tengfeng Xie ◽

Kei-ichiro Kumada ◽

Shigeru Kishimoto ◽

Takashi Mizutani

Keyword(s):

Layered Structures ◽

Kelvin Probe ◽

Cross Sectional ◽