Measurement of Cross-Sectional Potential of InAlAs/InGaAs Layered Structures in Vacuum by Kelvin Probe Force Microscopy
2003 ◽
Vol 42
(Part 1, No. 4A)
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pp. 1751-1752
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2019 ◽
Vol 58
(SI)
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pp. SIIA04
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1998 ◽
Vol 37
(Part 1, No. 3B)
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pp. 1522-1526
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2015 ◽
Vol 54
(3)
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pp. 030306
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