Reflection and refraction of a spherical acoustic wave from a thin layer

1986 ◽  
Vol 27 (6) ◽  
pp. 1694-1700 ◽  
Author(s):  
N. C. Banik ◽  
I. Lerche
Keyword(s):  
Acoustic Wave ◽  
Thin Layer ◽  
Reflection And Refraction

scholarly journals XIII. On the reflection and refraction of light

1894 ◽  
Vol 185 ◽  
pp. 823-885 ◽  
Keyword(s):  
Thin Layer ◽  
Reflection And Refraction ◽  
Elliptic Polarization ◽  
Transparent Media

The object of the following paper is to examine how far the hypothesis of a thin layer of transition between two transparent media will explain in detail the phenomena connected with the elliptic polarization produced by reflection at the boundary of two such media. This problem has been approached by the following writers :—L. Lorenz, ‘Poggendorff Annalen,’ 114, p. 460; Van Ryn Van Alkemaade, ‘Wiedemann Annalen,’ 20, p. 23; and P. Drude, 'Wiedemann Annalen, '34 and 36.

Applications of Photoelectron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 506-507
Author(s):  
William J. Baxter
Keyword(s):  
Electron Microscopy ◽  
Thermal Decomposition ◽  
Chemical Composition ◽  
Ultraviolet Radiation ◽  
Thin Layer ◽  
Edge Effects ◽  
Electron Optics ◽  
Surface Layers ◽  
Crystalline Orientation ◽  
Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

STUDY OF DEFECTS IN a-Ge AND a-GeHxUSING SURFACE ACOUSTIC WAVE TECHNIQUE

1981 ◽  
Vol 42 (C4) ◽  
pp. C4-365-C4-368
Author(s):  
K. L. Bhatia ◽  
M.v. Haumeder ◽  
S. Hunklinger
Keyword(s):  
Acoustic Wave ◽  
Surface Acoustic Wave ◽  
Wave Technique
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