XIII. On the reflection and refraction of light

Philosophical Transactions of the Royal Society of London. (A.) ◽

10.1098/rsta.1894.0013 ◽

1894 ◽

Vol 185 ◽

pp. 823-885 ◽

Cited By ~ 1

Keyword(s):

Thin Layer ◽

Reflection And Refraction ◽

Elliptic Polarization ◽

Transparent Media

The object of the following paper is to examine how far the hypothesis of a thin layer of transition between two transparent media will explain in detail the phenomena connected with the elliptic polarization produced by reflection at the boundary of two such media. This problem has been approached by the following writers :—L. Lorenz, ‘Poggendorff Annalen,’ 114, p. 460; Van Ryn Van Alkemaade, ‘Wiedemann Annalen,’ 20, p. 23; and P. Drude, 'Wiedemann Annalen, '34 and 36.

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Reflection and refraction of a spherical acoustic wave from a thin layer

Journal of Mathematical Physics ◽

10.1063/1.527085 ◽

1986 ◽

Vol 27 (6) ◽

pp. 1694-1700 ◽

Cited By ~ 1

Author(s):

N. C. Banik ◽

I. Lerche

Keyword(s):

Acoustic Wave ◽

Thin Layer ◽

Reflection And Refraction

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Refraction of electromagnetic waves in pseudo-passive media

Journal of Physics Conference Series ◽

10.1088/1742-6596/2140/1/012024 ◽

2021 ◽

Vol 2140 (1) ◽

pp. 012024

Author(s):

V V Fisanov

Keyword(s):

Electromagnetic Waves ◽

Total Reflection ◽

Monochromatic Wave ◽

Reflection And Transmission ◽

Material Parameters ◽

Flat Interface ◽

Reflection And Refraction ◽

Transparent Media ◽

Wave Phenomena ◽

Fresnel Coefficients

Abstract The problem of reflection and refraction of a plane monochromatic wave is considered in the most general formulation for a flat interface of two isotropic pseudo-passive media using the vector covariant approach of F.I. Fedorov. The generalized Fresnel coefficients for the perpendicular and parallel polarizations turn out to be complex values, except for cases when the phase difference of the permeabilities of the two media is zero or 180 degrees. The critical Brewster angles also turn out to be complex quantities. The phenomenon of total reflection, in contrast to passive transparent media, is not realized in pseudo-passive media. The energy coefficients of reflection and transmission are calculated and analyzed. Restrictions imposed on the values of the material parameters of the problem are indicated, which should be taken into account when studying refractive wave phenomena involving pseudo-passive metamaterials.

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Applications of Photoelectron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092499 ◽

1976 ◽

Vol 34 ◽

pp. 506-507

Author(s):

William J. Baxter

Keyword(s):

Electron Microscopy ◽

Thermal Decomposition ◽

Chemical Composition ◽

Ultraviolet Radiation ◽

Thin Layer ◽

Edge Effects ◽

Electron Optics ◽

Surface Layers ◽

Crystalline Orientation ◽

Fluorescent Screen

In this form of electron microscopy, photoelectrons emitted from a metal by ultraviolet radiation are accelerated and imaged onto a fluorescent screen by conventional electron optics. image contrast is determined by spatial variations in the intensity of the photoemission. The dominant source of contrast is due to changes in the photoelectric work function, between surfaces of different crystalline orientation, or different chemical composition. Topographical variations produce a relatively weak contrast due to shadowing and edge effects.Since the photoelectrons originate from the surface layers (e.g. ∼5-10 nm for metals), photoelectron microscopy is surface sensitive. Thus to see the microstructure of a metal the thin layer (∼3 nm) of surface oxide must be removed, either by ion bombardment or by thermal decomposition in the vacuum of the microscope.

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