Base pressure effect on electrical properties of chromium nanofilms

2021 ◽  
Vol 47 (12) ◽  
pp. 1030-1032
Author(s):  
L. Shiva ◽  
Chitralekha Alur ◽  
N. Ayachit ◽  
L. Udachan ◽  
S. Bhairamadagi ◽  
...  
1973 ◽  
Vol 35 (4) ◽  
pp. 1263-1263 ◽  
Author(s):  
Shûsuke Yomo ◽  
Nobuo Môri ◽  
Tadayasu Mitsui ◽  
Shinji Ogawa

2003 ◽  
Vol 133-134 ◽  
pp. 405-406 ◽  
Author(s):  
E.B. Lopes ◽  
R.T. Henriques ◽  
M. Almeida ◽  
E. Ribera ◽  
M. Mas-Torrent ◽  
...  

2018 ◽  
Vol 64 (6) ◽  
pp. 566 ◽  
Author(s):  
Jorge Alberto García Valenzuela ◽  
Dagoberto Cabrera-German ◽  
Marcos Cota-Leal ◽  
Guillermo Suárez-Campos ◽  
Miguel Martínez-Gil ◽  
...  

In a previous paper, we reported that thin films of ZnO:Al [aluminum-zinc oxide (AZO)] deposited after achieving a very low base pressure [from 4.0×10–7 Torr (5.6×10–5 Pa) to 5.7×10–7 Torr (7.6×10–5 Pa)] result dark yellow in color and are resistive. These are undesirable characteristics for the application of AZO thin films as front electrodes in solar cells. However, given the increasingly tendency in the acquisition of equipment that allow us to reach excellent vacuum levels, it is necessary to find the deposition conditions that lead to an improving of transmittance without greatly impacting the electrical properties of materials deposited after achieving these levels of vacuum. In this way, the present work is focused on AZO thin films deposited after achieving a very low base pressure value: 4.2×10–7 Torr (5.6×10–5 Pa). For this, we studied the effect of the variation of the oxygen volume percent in the argon/oxygen mixture (by maintaining the deposition pressure constant) and the effect of deposition pressure with only argon gas on the main properties of AZO thin films. The depositions were done at room temperature on glass substrates by direct-current magnetron sputtering with a power of 120 W (corresponding to a power density of 2.63 W/cm2). As results, we found that the variation of deposition pressure with only argon gas is a good option for the control of optical and electrical properties, since the addition of oxygen, although improves transmittance, greatly impacts on the electrical properties. Furthermore, an interesting correlation was found between the optical and electrical properties and the chemical composition of the AZO films, the latter depending on the argon pressure (for this, a careful X-ray photoelectron spectroscopy analysis was performed). Also, the inverse relationship between crystallinity and deposition rate was confirmed, in which deposition rate inversely depends on argon pressure.


1973 ◽  
Vol 13 (8) ◽  
pp. 1083-1085 ◽  
Author(s):  
N. Mori ◽  
T. Mitsui ◽  
S. Yomo

2003 ◽  
Vol 93 (4) ◽  
pp. 1991-1994 ◽  
Author(s):  
X. Wang ◽  
Z. X. Bao ◽  
Y. L. Zhang ◽  
F. Y. Li ◽  
R. C. Yu ◽  
...  

2011 ◽  
Vol 1287 ◽  
Author(s):  
Beom-jong Kim ◽  
Dong-chan Kim ◽  
Yoon-jae Kim. ◽  
Han-jin Lim ◽  
Ju-eun Kim ◽  
...  

ABSTRACTWe investigated the pressure dependence of the inductive coupled plasma (ICP) oxidation on the electrical characteristics of the thin oxide films. Activation energies and electron temperatures with different pressures were estimated. To demonstrate the pressure effect on the plasma oxide quality, simple N type metal-oxide-semiconductor (NMOS) transistors were fabricated and investigated in a few electrical properties. At higher pressure than 200mTorr, plasma oxide has a slightly higher on-current and a lower interfacial trap density. The on-current gain seems to be related to the field mobility increase and the lower defective interface to the electron temperature during oxidation.


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