scholarly journals Frequency shift algorithm: Application to a frequency-domain multiplexing readout of x-ray transition-edge sensor microcalorimeters

2021 ◽  
Vol 92 (3) ◽  
pp. 033103
Author(s):  
D. Vaccaro ◽  
H. Akamatsu ◽  
J. van der Kuur ◽  
P. van der Hulst ◽  
A. C. T. Nieuwenhuizen ◽  
...  
Keyword(s):  
Frequency Shift ◽  
Frequency Domain ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Frequency Domain Multiplexing ◽  
Transition Edge

scholarly journals Thermal crosstalk of X-ray transition-edge sensor micro-calorimeters under frequency domain multiplexing readout

2021 ◽  
pp. 1-1
Author(s):  
Davide Vaccaro ◽  
Hiroki Akamatsu ◽  
Marcel Bruijn ◽  
Luciano Gottardi ◽  
Roland Den Hartog ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Frequency Domain Multiplexing ◽  
Transition Edge

scholarly journals Demonstration of MHz frequency domain multiplexing readout of 37 transition edge sensors for high-resolution x-ray imaging spectrometers

2021 ◽  
Vol 119 (18) ◽  
pp. 182601
Author(s):  
H. Akamatsu ◽  
D. Vaccaro ◽  
L. Gottardi ◽  
J. van der Kuur ◽  
C. P. de Vries ◽  
...  
Keyword(s):  
High Resolution ◽  
Frequency Domain ◽  
Transition Edge Sensors ◽  
X Ray ◽  
Frequency Domain Multiplexing ◽  
Transition Edge ◽  
X Ray Imaging

Frequency domain multiplexing technology of transition-edge sensors for x-ray astronomy

2020 ◽  
Author(s):  
Hiroki Akamatsu ◽  
Davide Vaccaro ◽  
Luciano Gottardi ◽  
Jan van der Kuur ◽  
Cor P. de Vries ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Transition Edge Sensors ◽  
X Ray ◽  
Frequency Domain Multiplexing ◽  
Transition Edge

Thermal Design and Characterization of Transition-Edge Sensor (TES) Bolometers for Frequency-Domain Multiplexing

2009 ◽  
Vol 19 (3) ◽  
pp. 496-500 ◽  
Author(s):  
M. Lueker ◽  
B.A. Benson ◽  
C.L. Chang ◽  
Hsiao-Mei Cho ◽  
M. Dobbs ◽  
...  
Keyword(s):  
Frequency Domain ◽  
Transition Edge Sensor ◽  
Thermal Design ◽  
Frequency Domain Multiplexing ◽  
Transition Edge ◽  
Tes Bolometers

High Count-Rate Studies of Small-Pitch Transition-Edge Sensor X-ray Microcalorimeters

2014 ◽  
Vol 176 (3-4) ◽  
pp. 597-603 ◽  
Author(s):  
S. J. Lee ◽  
S. R. Bandler ◽  
S. E. Busch ◽  
J. S. Adams ◽  
J. A. Chervenak ◽  
...  
Keyword(s):  
Count Rate ◽  
Transition Edge Sensor ◽  
High Count ◽  
High Count Rate ◽  
X Ray ◽  
Transition Edge ◽  
Small Pitch

Phonon-mediated distributed transition-edge-sensor X-ray detectors for surveys of galaxy clusters and the warm-hot interstellar medium

2006 ◽  
Vol 559 (2) ◽  
pp. 488-490 ◽  
Author(s):  
Steven W. Leman ◽  
Paul L. Brink ◽  
Blas Cabrera ◽  
Joseph P. Castle ◽  
Sudeepto Chakraborty ◽  
...  
Keyword(s):  
Interstellar Medium ◽  
Galaxy Clusters ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Transition Edge

Fine pitch transition-edge sensor X-ray microcalorimeters with sub-eV energy resolution at 1.5 keV

2015 ◽  
Vol 107 (22) ◽  
pp. 223503 ◽  
Author(s):  
S. J. Lee ◽  
J. S. Adams ◽  
S. R. Bandler ◽  
J. A. Chervenak ◽  
M. E. Eckart ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Fine Pitch ◽  
Transition Edge

scholarly journals Quantitative Analysis on an Electron Probe with the NIST Transition Edge Sensor Microcalorimeter X-ray Detector

2006 ◽  
Vol 12 (S02) ◽  
pp. 832-833
Author(s):  
T Jach ◽  
J Ullom ◽  
N Ritchie ◽  
J Beall
Keyword(s):  
Quantitative Analysis ◽  
Electron Probe ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Transition Edge

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Transition-edge sensor array development for the ATHENA x-ray itegral field unit (Conference Presentation)

2018 ◽  
Author(s):  
Stephen J. Smith ◽  
Joseph S. Adams ◽  
Simon R. Bandler ◽  
James A. Chervenak ◽  
Megan E. Eckart ◽  
...  
Keyword(s):  
Sensor Array ◽  
Transition Edge Sensor ◽  
X Ray ◽  
Transition Edge ◽  
Field Unit

High sensitivity X-ray analysis for a low accelerating voltage scanning electron microscope using a transition edge sensor

Microscopy ◽  
2020 ◽  
Vol 69 (5) ◽  
pp. 298-303
Author(s):  
Keiichi Tanaka ◽  
Akira Takano ◽  
Atsushi Nagata ◽  
Satoshi Nakayama ◽  
Kaname Takahashi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Intensity Ratio ◽  
Transition Edge Sensor ◽  
High Energy Resolution ◽  
Peak Intensity Ratio ◽  
X Ray ◽  
Peak Intensity ◽  
Transition Edge ◽  
Scanning Electron

Abstract A scanning electron microscope transition edge sensor has been developed to analyze the minor or trace constituents contained in a bulk sample and small particles on the sample under a low accelerating voltage (typically <3 keV). The low accelerating voltage enables to improve the spatial analysis resolution because the primary electron diffusion length is limited around the sample surface. The characteristic points of our transition edge sensor are 1) high-energy resolution at 7.2 eV@Al-Kα, 2) continuous operation by using a cryogen-free dilution refrigerator and 3) improvement of transmission efficiency at B-Kα by using thin X-ray film windows between the sample and detector (about 30 times better than our previous system). Our system could achieve a stabilization of the peak shift at Nd-Mα (978 eV) within 1 eV during an operation time of 27 000 s. The detection limits with B-Kα for detection times 600 and 27 000 s were 0.27 and 0.038 wt%, respectively. We investigated the peak separation ability by measuring the peak intensity ratio between the major constitute (silicon) and the minor constitute (tungsten) because the Si-Kα line differs from the W-Mα line by only 35 eV and a small W-Mα peak superimposed on the tail of the large Si-Kα peak. The peak intensity ratio (I(W-Mα)/I(Si-Kα)) was adjusted by the W particle area ratio compared with the Si substrate area. The transition edge sensor could clearly separate the Si-Kα and W-Mα lines even under a peak intensity ratio of 0.01.

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