Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy
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2008 ◽
Vol 181
(7)
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pp. 1670-1677
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Keyword(s):
2006 ◽
pp. 1529-1532
2000 ◽
Vol 40
(8-10)
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pp. 1401-1406
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2000 ◽
Vol 370
(1-2)
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pp. 238-242
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