Sizeable bandgap modulation in Y2Hf2O7 pyrochlore oxide thin films through B-site substitution

2021 ◽  
Vol 118 (14) ◽  
pp. 141902
Author(s):  
M. Zhu ◽  
X. Liang ◽  
B. B. Yang ◽  
S. J. Zhu ◽  
C. Xie ◽  
...  
Keyword(s):  
Thin Films ◽  
Oxide Thin Films ◽  
Pyrochlore Oxide

scholarly journals Topological phases in layered pyrochlore oxide thin films along the [111] direction

2012 ◽  
Vol 86 (23) ◽  
Author(s):  
Xiang Hu ◽  
Andreas Rüegg ◽  
Gregory A. Fiete
Keyword(s):  
Thin Films ◽  
Topological Phases ◽  
Oxide Thin Films ◽  
Pyrochlore Oxide

Effects of dopant concentration on the microstructure of tin- doped indium oxide thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 716-717
Author(s):  
I. A. Rauf
Keyword(s):  
Thin Films ◽  
Indium Oxide ◽  
Ionic Radius ◽  
Free Carrier ◽  
Electron Gun ◽  
Periodic Lattice ◽  
Oxide Thin Films ◽  
Transmission Electron ◽  
The Difference ◽  
Dopant Atoms

To understand the electronic conduction mechanism in Sn-doped indium oxide thin films, it is important to study the effect of dopant atoms on the neighbouring indium oxide lattice. Ideally Sn is a substitutional dopant at random indium sites. The difference in valence (Sn4+ replaces In3+) requires that an extra electron is donated to the lattice and thus contributes to the free carrier density. But since Sn is an adjacent member of the same row in the periodic table, the difference in the ionic radius (In3+: 0.218 nm; Sn4+: 0.205 nm) will introduce a strain in the indium oxide lattice. Free carrier electron waves will no longer see a perfect periodic lattice and will be scattered, resulting in the reduction of free carrier mobility, which will lower the electrical conductivity (an undesirable effect in most applications).One of the main objectives of the present investigation is to understand the effects of the strain (produced by difference in the ionic radius) on the microstructure of the indium oxide lattice when the doping level is increased to give high carrier densities. Sn-doped indium oxide thin films were prepared with four different concentrations: 9, 10, 11 and 12 mol. % of SnO2 in the starting material. All the samples were prepared at an oxygen partial pressure of 0.067 Pa and a substrate temperature of 250°C using an Edwards 306 coating unit with an electron gun attachment for heating the crucible. These deposition conditions have been found to give optimum electrical properties in Sn-doped indium oxide films. A JEOL 2000EX transmission electron microscope was used to investigate the specimen microstructure.

The growth of manganese oxide thin films by spray pyrolysis technique

2012 ◽  
Vol 1 (2) ◽  
pp. 159-161
Author(s):  
M.Sudha M.Sudha ◽  
◽  
P.Duraisamy P.Duraisamy
Keyword(s):  
Thin Films ◽  
Manganese Oxide ◽  
Spray Pyrolysis ◽  
Spray Pyrolysis Technique ◽  
Oxide Thin Films

Preparation and Hemocompatibility of Neodymium Incorporated Zinc Oxide Thin Films

2011 ◽  
Vol 26 (9) ◽  
pp. 993-997
Author(s):  
Zhan-Yun HUANG ◽  
Ping LUO ◽  
Di-Hu CHEN
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Oxide Thin Films

Formation of Functional Oxide Thin Films Using Plasma-Assisted Reactive Process

2020 ◽  
Vol 89 (7) ◽  
pp. 472-475
Author(s):  
Kosuke TAKENAKA ◽  
Yuichi SETSUHARA
Keyword(s):  
Thin Films ◽  
Oxide Thin Films ◽  
Reactive Process

Extracting the effective mass of electrons in transparent conductive oxide thin films using Seebeck coefficient

2014 ◽  
Vol 104 (21) ◽  
pp. 212103 ◽  
Author(s):  
Yaqin Wang ◽  
Junhao Zhu ◽  
Wu Tang
Keyword(s):  
Thin Films ◽  
Seebeck Coefficient ◽  
Effective Mass ◽  
Transparent Conductive Oxide ◽  
Oxide Thin Films ◽  
Conductive Oxide

Structure-property correlations in aluminum oxide thin films grown by reactive AC magnetron sputtering

2006 ◽  
Vol 201 (3-4) ◽  
pp. 1109-1116 ◽  
Author(s):  
Atul Khanna ◽  
Deepak G. Bhat ◽  
Adrian Harris ◽  
Ben D. Beake
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Aluminum Oxide ◽  
Structure Property ◽  
Oxide Thin Films ◽  
Property Correlations

Mechanical and optical properties of oxide thin films deposited by pulsed laser reactive evaporation

Vacuum ◽  
1990 ◽  
Vol 40 (4) ◽  
pp. 399-405 ◽  
Author(s):  
L. Shi ◽  
H.J. Frankena ◽  
H. Mulder
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Pulsed Laser ◽  
Oxide Thin Films ◽  
Reactive Evaporation
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