Quantitative analysis of defect states in amorphous InGaZnO thin-film transistors using photoinduced current transient spectroscopy

2021 ◽  
Vol 130 (1) ◽  
pp. 015704
Author(s):  
Hyunmin Hong ◽  
Kwang-Sik Jeong ◽  
Jun Hyung Lim ◽  
Kyoung Seok Son ◽  
Kwun-Bum Chung
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Thin Film Transistors ◽  
Current Transient ◽  
Defect States ◽  
Transient Spectroscopy ◽  
Amorphous Ingazno

Quantitative Analysis of Negative Bias Illumination Stress-Induced Instability Mechanisms in Amorphous InGaZnO Thin-Film Transistors

2011 ◽  
Vol 59 (2(1)) ◽  
pp. 474-477 ◽  
Author(s):  
Yongsik Kim ◽  
Min-Kyung Bae ◽  
Dongsik Kong ◽  
Hyun Kwnag Jung ◽  
Jeahyeong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Quantitative Analysis ◽  
Thin Film Transistors ◽  
Negative Bias ◽  
Amorphous Ingazno ◽  
Negative Bias Illumination Stress

The Instability Characteristics of Amorphous Silicon Thin Film Transistors with Various Interfacial and Bulk Defect States

1997 ◽  
Vol 36 (Part 1, No. 10) ◽  
pp. 6226-6229 ◽  
Author(s):  
Huang-Chung Cheng ◽  
Jun-Wei Tsai ◽  
Chun-Yao Huang ◽  
Fang-Chen Luo ◽  
Hsing-Chien Tuan
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Defect States ◽  
Silicon Thin Film

Interface dependent electrical properties of amorphous InGaZnO[sub 4] thin film transistors

2009 ◽  
Vol 27 (1) ◽  
pp. 126 ◽  
Author(s):  
Wantae Lim ◽  
Jung Hun Jang ◽  
S.-H. Kim ◽  
D. P. Norton ◽  
V. Craciun ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Thin Film Transistors ◽  
Amorphous Ingazno

Above-Threshold $1\!/\!f$ Noise Expression for Amorphous InGaZnO Thin-Film Transistors Considering Series Resistance Noise

2015 ◽  
Vol 36 (10) ◽  
pp. 1056-1059 ◽  
Author(s):  
Hongyu He ◽  
Xueren Zheng ◽  
Shengdong Zhang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Series Resistance ◽  
Resistance Noise ◽  
Amorphous Ingazno

Modulation of Interface and Bulk States in Amorphous InGaZnO Thin-Film Transistors with Double Stacked Channel Layers

2013 ◽  
Vol 52 (9R) ◽  
pp. 090205 ◽  
Author(s):  
Runze Zhan ◽  
Chengyuan Dong ◽  
Bo-Ru Yang ◽  
Han-Ping D. Shieh
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Amorphous Ingazno

High-Mobility Amorphous InGaZnO Thin-Film Transistors With Nitrogen Introduced via Low-Temperature Annealing

2021 ◽  
Vol 42 (10) ◽  
pp. 1480-1483
Author(s):  
Yining Yu ◽  
Nannan Lv ◽  
Dongli Zhang ◽  
Yiran Wei ◽  
Mingxiang Wang
Keyword(s):  
Thin Film ◽  
Low Temperature ◽  
Thin Film Transistors ◽  
High Mobility ◽  
Low Temperature Annealing ◽  
Amorphous Ingazno

Asymmetrical degradation behaviors in amorphous InGaZnO thin-film transistors under various gate and drain bias stresses

2015 ◽  
Vol 33 (1) ◽  
pp. 011202 ◽  
Author(s):  
Daeun Lee ◽  
Chan-Yong Jeong ◽  
Sang-Hun Song ◽  
Jin Xiao-Shi ◽  
Jong In Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Bias ◽  
Degradation Behaviors ◽  
Amorphous Ingazno

Flexible hybrid complementary inverters with high gain and balanced noise margins using pentacene and amorphous InGaZnO thin-film transistors

2010 ◽  
Vol 11 (6) ◽  
pp. 1074-1078 ◽  
Author(s):  
J.B. Kim ◽  
C. Fuentes-Hernandez ◽  
S.-J. Kim ◽  
S. Choi ◽  
B. Kippelen
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
High Gain ◽  
Complementary Inverters ◽  
Amorphous Ingazno

Analytical surface-potential-based drain current model for amorphous InGaZnO thin film transistors

2013 ◽  
Vol 114 (18) ◽  
pp. 184502 ◽  
Author(s):  
A. Tsormpatzoglou ◽  
N. A. Hastas ◽  
N. Choi ◽  
F. Mahmoudabadi ◽  
M. K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Potential ◽  
Thin Film Transistors ◽  
Current Model ◽  
Drain Current ◽  
Amorphous Ingazno

Effects of geometrically extended contact area on electrical properties in amorphous InGaZnO thin film transistors

2014 ◽  
Vol 558 ◽  
pp. 279-282 ◽  
Author(s):  
Jae-Sung Kim ◽  
Min-Kyu Joo ◽  
Ming Xing Piao ◽  
Seung-Eon Ahn ◽  
Yong-Hee Choi ◽  
...  
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Contact Area ◽  
Thin Film Transistors ◽  
Extended Contact ◽  
Amorphous Ingazno
Sign in / Sign up

Export Citation Format

Share Document