The Instability Characteristics of Amorphous Silicon Thin Film Transistors with Various Interfacial and Bulk Defect States
1997 ◽
Vol 36
(Part 1, No. 10)
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pp. 6226-6229
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1995 ◽
Vol 34
(Part 2, No. 2B)
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pp. L217-L219
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1989 ◽
Vol 28
(Part 1, No. 11)
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pp. 2197-2200
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1989 ◽
Vol 115
(1-3)
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pp. 141-143
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