Measurement of single event effects induced by alpha particles in the Xilinx Zynq-7010 System-on-Chip

2016 ◽  
pp. 1-6 ◽  
Author(s):  
Xuecheng Du ◽  
Chaohui He ◽  
Shuhuan Liu ◽  
Yao Zhang ◽  
Yonghong Li ◽  
...  
Keyword(s):  
System On Chip ◽  
Alpha Particles ◽  
Single Event ◽  
Single Event Effects ◽  
On Chip

Single-event effects induced by medium-energy protons in 28 nm system-on-chip

2019 ◽  
Vol 30 (10) ◽  
Author(s):  
Wei-Tao Yang ◽  
Qian Yin ◽  
Yang Li ◽  
Gang Guo ◽  
Yong-Hong Li ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Medium Energy ◽  
Single Event Effects ◽  
On Chip ◽  
28 Nm

Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip

2017 ◽  
Vol 71 ◽  
pp. 65-70 ◽  
Author(s):  
Xuecheng Du ◽  
Shuhuan Liu ◽  
Dongyang Luo ◽  
Yao Zhang ◽  
Xiaozhi Du ◽  
...  
Keyword(s):  
System On Chip ◽  
Low Energy ◽  
Single Event ◽  
Single Event Effects ◽  
Energy Proton ◽  
On Chip

Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09

2019 ◽  
Vol 99 ◽  
pp. 119-124 ◽  
Author(s):  
Weitao Yang ◽  
Yonghong Li ◽  
Yang Li ◽  
Zhiliang Hu ◽  
Fei Xie ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
Effect Test

Investigation of single event effect in 28-nm system-on-chip with multi patterns

2020 ◽  
Vol 29 (10) ◽  
pp. 108504
Author(s):  
Wei-Tao Yang ◽  
Yong-Hong Li ◽  
Ya-Xin Guo ◽  
Hao-Yu Zhao ◽  
Yang Li ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
28 Nm

Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories

2003 ◽  
Vol 50 (6) ◽  
pp. 2322-2327 ◽  
Author(s):  
R. Harboe-Sorensen ◽  
F.-X. Guerre ◽  
J.-G. Loquet ◽  
C. Tizon
Keyword(s):  
Heavy Ion ◽  
High Density ◽  
Single Event ◽  
Single Event Effects ◽  
On Chip

SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND

2004 ◽  
Vol 14 (02) ◽  
pp. 285-298 ◽  
Author(s):  
EUGENE NORMAND
Keyword(s):  
Fault Tolerant ◽  
Random Access ◽  
Random Access Memory ◽  
Ground Level ◽  
Alpha Particles ◽  
Packaging Materials ◽  
Single Event ◽  
Access Memory ◽  
Single Event Effects ◽  
Negligible Contribution

Single event effects in electronics caused by the atmospheric neutrons have been an issue for systems using large blocks of random access memory (RAM) in avionics applications as well as those on the ground. At ground level there are two main sources of single event effects, alpha particles from the packaging materials as well as the neutrons, but at aircraft altitudes, where the neutron flux is about 300 times higher than the ground, the alpha particles make a negligible contribution. We review the trends over the last 5-10 years in the response of COTS computer systems to single event effects, taking into the response of devices as well as fault tolerant measures incorporated into the systems.

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

2018 ◽  
Vol 65 (1) ◽  
pp. 545-549 ◽  
Author(s):  
Weitao Yang ◽  
Xuecheng Du ◽  
Chaohui He ◽  
Shuting Shi ◽  
Li Cai ◽  
...  
Keyword(s):  
Heavy Ion ◽  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
28 Nm
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