Atomic-scale quantitative elemental analysis of boundary layers in a SrTiO3ceramic condenser by high-angle annular dark-field electron microscopy
2001 ◽
Vol 81
(1)
◽
pp. 245-260
◽
2001 ◽
Vol 81
(2)
◽
pp. 123-127
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Keyword(s):
1978 ◽
Vol 36
(2)
◽
pp. 190-191
1976 ◽
Vol 34
◽
pp. 160-161
Keyword(s):
Keyword(s):