Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Philosophical Magazine A ◽

10.1080/01418619808224072 ◽

1998 ◽

Vol 77 (3) ◽

pp. 621-640 ◽

Author(s):

C. E. Kril ◽

R. Birringer

Keyword(s):

Nanocrystalline Materials ◽

Profile Analysis ◽

Size Distributions ◽

X Ray Diffraction ◽

Diffraction Profile ◽

X Ray ◽

Grain Size Distributions

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Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Philosophical Magazine A ◽

10.1080/014186198254281 ◽

1998 ◽

Vol 77 (3) ◽

pp. 621-640 ◽

Author(s):

C. E. Krill R. Birringer

Keyword(s):

Nanocrystalline Materials ◽

Profile Analysis ◽

Size Distributions ◽

X Ray Diffraction ◽

Diffraction Profile ◽

X Ray ◽

Grain Size Distributions

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Evaluation of Grain Size Distributions of Cu Interconnects with Less than 100nm Width by X-ray Diffraction Method

ECS Meeting Abstracts ◽

10.1149/ma2011-02/28/1936 ◽

2011 ◽

Keyword(s):

Diffraction Method ◽

Size Distributions ◽

X Ray Diffraction ◽

X Ray ◽

Cu Interconnects ◽

Grain Size Distributions

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Formation process of nanocrystalline materials from x-ray diffraction profile analysis: Application to platinum catalysts

Journal of Applied Physics ◽

10.1063/1.1453495 ◽

2002 ◽

Vol 91 (7) ◽

pp. 4556-4561 ◽

Author(s):

P. Ascarelli ◽

V. Contini ◽

R. Giorgi

Keyword(s):

Formation Process ◽

Nanocrystalline Materials ◽

Profile Analysis ◽

Platinum Catalysts ◽

X Ray Diffraction ◽

Diffraction Profile ◽

X Ray ◽

Analysis Application

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Development of a Nondestructive Method Utilizing X-ray Diffraction for the Evaluation of Grain Size Distributions of Cu Interconnects

Electrochemical and Solid-State Letters ◽

10.1149/1.3556985 ◽

2011 ◽

Vol 14 (5) ◽

pp. H208 ◽

Author(s):

Takashi Inami ◽

Jin Onuki ◽

Minoru Isshiki

Keyword(s):

Nondestructive Method ◽

Size Distributions ◽

X Ray Diffraction ◽

X Ray ◽

Cu Interconnects ◽

Grain Size Distributions

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Evaluation of Grain Size Distributions of 50nm Wide Cu Interconnects by X-ray Diffraction Method

ECS Meeting Abstracts ◽

10.1149/ma2012-02/34/2745 ◽

2012 ◽

Keyword(s):

Diffraction Method ◽

Size Distributions ◽

X Ray Diffraction ◽

X Ray ◽

Cu Interconnects ◽

Grain Size Distributions

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Evaluation of Grain Size Distributions of Cu Interconnects with Less Than 100nm Width by X-ray Diffraction Method

ECS Transactions ◽

10.1149/1.4717498 ◽

2019 ◽

Vol 41 (43) ◽

pp. 11-14

Author(s):

Takashi Inami ◽

Jin Onuki

Keyword(s):

Diffraction Method ◽

Size Distributions ◽

X Ray Diffraction ◽

X Ray ◽

Cu Interconnects ◽

Grain Size Distributions

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Determination of grain size distributions in magnetic recording media by grazing incidence X-ray diffraction

IEEE Transactions on Magnetics ◽

10.1109/20.951017 ◽

2001 ◽

Vol 37 (4) ◽

pp. 1947-1949 ◽

Author(s):

Shaoping Li ◽

C. Potter ◽

D. Palmer ◽

D.D. Eberl ◽

T. Klemmer ◽

...

Keyword(s):

Magnetic Recording ◽

Grazing Incidence ◽

Recording Media ◽

Size Distributions ◽

Magnetic Recording Media ◽

X Ray Diffraction ◽

X Ray ◽

Grain Size Distributions

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Evaluation of Grain Size Distributions of 50nm Wide Cu Interconnects by X-ray Diffraction Method

ECS Transactions ◽

10.1149/05032.0057ecst ◽

2013 ◽

Vol 50 (32) ◽

pp. 57-60

Author(s):

T. Inami ◽

J. Onuki

Keyword(s):

Diffraction Method ◽

Size Distributions ◽

X Ray Diffraction ◽

X Ray ◽

Cu Interconnects ◽

Grain Size Distributions

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Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry

Acta Materialia ◽

10.1016/j.actamat.2005.08.018 ◽

2006 ◽

Vol 54 (1) ◽

pp. 1-10 ◽

Author(s):

F SANCHEZBAJO ◽

A ORTIZ ◽

F CUMBRERA

Keyword(s):

Analytical Model ◽

Nanocrystalline Materials ◽

Size Distributions ◽

X Ray ◽

Grain Size Distributions

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X-Ray Diffraction Profile Analysis for Characterizing Isothermal Aging Behavior of M250 Grade Maraging Steel

Metallurgical and Materials Transactions A ◽

10.1007/s11661-008-9550-1 ◽

2008 ◽

Vol 39 (8) ◽

pp. 1978-1984 ◽

Author(s):

S. Mahadevan ◽

T. Jayakumar ◽

B.P.C. Rao ◽

Anish Kumar ◽

K.V. Rajkumar ◽

...

Keyword(s):

Maraging Steel ◽

Isothermal Aging ◽

Profile Analysis ◽

X Ray Diffraction ◽

Aging Behavior ◽

Diffraction Profile ◽

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