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Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis
Philosophical Magazine A
◽
10.1080/014186198254281
◽
1998
◽
Vol 77
(3)
◽
pp. 621-640
◽
Cited By ~ 5
Author(s):
C. E. Krill R. Birringer
Keyword(s):
Grain Size
◽
Nanocrystalline Materials
◽
Profile Analysis
◽
Size Distributions
◽
X Ray Diffraction
◽
Diffraction Profile
◽
X Ray
◽
Grain Size Distributions
Download Full-text
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Cited By
References
Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis
Philosophical Magazine A
◽
10.1080/01418619808224072
◽
1998
◽
Vol 77
(3)
◽
pp. 621-640
◽
Cited By ~ 295
Author(s):
C. E. Kril
◽
R. Birringer
Keyword(s):
Grain Size
◽
Nanocrystalline Materials
◽
Profile Analysis
◽
Size Distributions
◽
X Ray Diffraction
◽
Diffraction Profile
◽
X Ray
◽
Grain Size Distributions
Download Full-text
Evaluation of Grain Size Distributions of Cu Interconnects with Less than 100nm Width by X-ray Diffraction Method
ECS Meeting Abstracts
◽
10.1149/ma2011-02/28/1936
◽
2011
◽
Keyword(s):
Grain Size
◽
Diffraction Method
◽
Size Distributions
◽
X Ray Diffraction
◽
X Ray
◽
Cu Interconnects
◽
Grain Size Distributions
Download Full-text
Formation process of nanocrystalline materials from x-ray diffraction profile analysis: Application to platinum catalysts
Journal of Applied Physics
◽
10.1063/1.1453495
◽
2002
◽
Vol 91
(7)
◽
pp. 4556-4561
◽
Cited By ~ 43
Author(s):
P. Ascarelli
◽
V. Contini
◽
R. Giorgi
Keyword(s):
Formation Process
◽
Nanocrystalline Materials
◽
Profile Analysis
◽
Platinum Catalysts
◽
X Ray Diffraction
◽
Diffraction Profile
◽
X Ray
◽
Analysis Application
Download Full-text
Development of a Nondestructive Method Utilizing X-ray Diffraction for the Evaluation of Grain Size Distributions of Cu Interconnects
Electrochemical and Solid-State Letters
◽
10.1149/1.3556985
◽
2011
◽
Vol 14
(5)
◽
pp. H208
◽
Cited By ~ 7
Author(s):
Takashi Inami
◽
Jin Onuki
◽
Minoru Isshiki
Keyword(s):
Grain Size
◽
Nondestructive Method
◽
Size Distributions
◽
X Ray Diffraction
◽
X Ray
◽
Cu Interconnects
◽
Grain Size Distributions
Download Full-text
Evaluation of Grain Size Distributions of 50nm Wide Cu Interconnects by X-ray Diffraction Method
ECS Meeting Abstracts
◽
10.1149/ma2012-02/34/2745
◽
2012
◽
Keyword(s):
Grain Size
◽
Diffraction Method
◽
Size Distributions
◽
X Ray Diffraction
◽
X Ray
◽
Cu Interconnects
◽
Grain Size Distributions
Download Full-text
Evaluation of Grain Size Distributions of Cu Interconnects with Less Than 100nm Width by X-ray Diffraction Method
ECS Transactions
◽
10.1149/1.4717498
◽
2019
◽
Vol 41
(43)
◽
pp. 11-14
Author(s):
Takashi Inami
◽
Jin Onuki
Keyword(s):
Grain Size
◽
Diffraction Method
◽
Size Distributions
◽
X Ray Diffraction
◽
X Ray
◽
Cu Interconnects
◽
Grain Size Distributions
Download Full-text
Determination of grain size distributions in magnetic recording media by grazing incidence X-ray diffraction
IEEE Transactions on Magnetics
◽
10.1109/20.951017
◽
2001
◽
Vol 37
(4)
◽
pp. 1947-1949
◽
Cited By ~ 4
Author(s):
Shaoping Li
◽
C. Potter
◽
D. Palmer
◽
D.D. Eberl
◽
T. Klemmer
◽
...
Keyword(s):
Grain Size
◽
Magnetic Recording
◽
Grazing Incidence
◽
Recording Media
◽
Size Distributions
◽
Magnetic Recording Media
◽
X Ray Diffraction
◽
X Ray
◽
Grain Size Distributions
Download Full-text
Evaluation of Grain Size Distributions of 50nm Wide Cu Interconnects by X-ray Diffraction Method
ECS Transactions
◽
10.1149/05032.0057ecst
◽
2013
◽
Vol 50
(32)
◽
pp. 57-60
Author(s):
T. Inami
◽
J. Onuki
Keyword(s):
Grain Size
◽
Diffraction Method
◽
Size Distributions
◽
X Ray Diffraction
◽
X Ray
◽
Cu Interconnects
◽
Grain Size Distributions
Download Full-text
Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry
Acta Materialia
◽
10.1016/j.actamat.2005.08.018
◽
2006
◽
Vol 54
(1)
◽
pp. 1-10
◽
Cited By ~ 36
Author(s):
F SANCHEZBAJO
◽
A ORTIZ
◽
F CUMBRERA
Keyword(s):
Grain Size
◽
Analytical Model
◽
Nanocrystalline Materials
◽
Size Distributions
◽
X Ray
◽
Grain Size Distributions
Download Full-text
X-Ray Diffraction Profile Analysis for Characterizing Isothermal Aging Behavior of M250 Grade Maraging Steel
Metallurgical and Materials Transactions A
◽
10.1007/s11661-008-9550-1
◽
2008
◽
Vol 39
(8)
◽
pp. 1978-1984
◽
Cited By ~ 8
Author(s):
S. Mahadevan
◽
T. Jayakumar
◽
B.P.C. Rao
◽
Anish Kumar
◽
K.V. Rajkumar
◽
...
Keyword(s):
Maraging Steel
◽
Isothermal Aging
◽
Profile Analysis
◽
X Ray Diffraction
◽
Aging Behavior
◽
Diffraction Profile
◽
X Ray
Download Full-text
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