Evaluation of Grain Size Distributions of 50nm Wide Cu Interconnects by X-ray Diffraction Method
Keyword(s):
X Ray
◽
1998 ◽
Vol 77
(3)
◽
pp. 621-640
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2001 ◽
Vol 37
(4)
◽
pp. 1947-1949
◽
2000 ◽
Vol 321-324
◽
pp. 133-136
◽
Effect of Lattice Distortion Modification Processing on Crystallinity and Orientation of Ramie Fiber
2012 ◽
Vol 152-154
◽
pp. 634-637
◽
Keyword(s):
X Ray
◽