Determination of the energies of \[001]symmetric tilt boundaries in Cu from the shape of boundary SiO2

1997 ◽  
Vol 75 (6) ◽  
pp. 367-370 ◽  
Author(s):  
T. Mori ◽  
T. Ishii ◽  
M. Kajiha Ra ◽  
M. Kato
Author(s):  
W. Krakow ◽  
D. A. Smith

The successful determination of the atomic structure of [110] tilt boundaries in Au stems from the investigation of microscope performance at intermediate accelerating voltages (200 and 400kV) as well as a detailed understanding of how grain boundary image features depend on dynamical diffraction processes variation with specimen and beam orientations. This success is also facilitated by improving image quality by digital image processing techniques to the point where a structure image is obtained and each atom position is represented by a resolved image feature. Figure 1 shows an example of a low angle (∼10°) Σ = 129/[110] tilt boundary in a ∼250Å Au film, taken under tilted beam brightfield imaging conditions, to illustrate the steps necessary to obtain the atomic structure configuration from the image. The original image of Fig. 1a shows the regular arrangement of strain-field images associated with the cores of ½ [10] primary dislocations which are separated by ∼15Å.


Author(s):  
William Krakow ◽  
David A. Smith

Recent developments in specimen preparation, imaging and image analysis together permit the experimental determination of the atomic structure of certain, simple grain boundaries in metals such as gold. Single crystal, ∼125Å thick, (110) oriented gold films are vapor deposited onto ∼3000Å of epitaxial silver on (110) oriented cut and polished rock salt substrates. Bicrystal gold films are then made by first removing the silver coated substrate and placing in contact two suitably misoriented pieces of the gold film on a gold grid. Controlled heating in a hot stage first produces twist boundaries which then migrate, so reducing the grain boundary area, to give mixed boundaries and finally tilt boundaries perpendicular to the foil. These specimens are well suited to investigation by high resolution transmission electron microscopy.


1973 ◽  
pp. 423-435
Author(s):  
M. J. Marcinkowski ◽  
K. Sadananda ◽  
Wen Feng Tseng

2016 ◽  
Vol 116 ◽  
pp. 108-111 ◽  
Author(s):  
Eric N. Hahn ◽  
Saryu J. Fensin ◽  
Timothy C. Germann ◽  
Marc A. Meyers

1985 ◽  
Vol 26 (5) ◽  
pp. 341-352 ◽  
Author(s):  
Hiroaki Kurishita ◽  
Akira Ôishi ◽  
Haruyoshi Kubo ◽  
Hideo Yoshinaga

2005 ◽  
Vol 69 (11) ◽  
pp. 1010-1015
Author(s):  
Takashi Mizuguchi ◽  
Naoki Takata ◽  
Ken-ichi Ikeda ◽  
Hideharu Nakashima

1990 ◽  
Vol 51 (C1) ◽  
pp. C1-269-C1-274 ◽  
Author(s):  
R. MONZEN ◽  
K. KITAGAWA ◽  
H. MIURA ◽  
M. KATO ◽  
T. MORI

2019 ◽  
Vol 62 (4) ◽  
pp. 680-686
Author(s):  
G. M. Poletaev ◽  
M. D. Starostenkov ◽  
R. Yu. Rakitin ◽  
V. Ya. Tsellermaer ◽  
M. A. Ilyina

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