ELECTRICAL CHARACTERIZATION OF NICKEL OXIDE THIN FILMS DEPOSITED BY REACTIVE SPUTTERING FOR MEMORY APPLICATIONS

2005 ◽  
Vol 74 (1) ◽  
pp. 71-77 ◽  
Author(s):  
JANG WOO LEE ◽  
IK HYUN PARK ◽  
CHEE WON CHUNG
2015 ◽  
Vol 357 ◽  
pp. 838-844 ◽  
Author(s):  
J. Keraudy ◽  
J. García Molleja ◽  
A. Ferrec ◽  
B. Corraze ◽  
M. Richard-Plouet ◽  
...  

2012 ◽  
Vol 3 (6) ◽  
pp. 509-514 ◽  
Author(s):  
Raid A. Ismail ◽  
Sa’ad Ghafori ◽  
Ghada A. Kadhim

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