ELECTRICAL CHARACTERIZATION OF NICKEL OXIDE THIN FILMS DEPOSITED BY REACTIVE SPUTTERING FOR MEMORY APPLICATIONS
2005 ◽
Vol 74
(1)
◽
pp. 71-77
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2019 ◽
Vol 58
(5)
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pp. 055504
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Keyword(s):
2014 ◽
Vol 308
◽
pp. 199-205
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2010 ◽
Vol 94
(5)
◽
pp. 724-732
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Keyword(s):
1992 ◽
Vol 88
(15)
◽
pp. 2203
◽
Keyword(s):
1998 ◽
Vol 94
(24)
◽
pp. 3665-3670
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Keyword(s):
2015 ◽
Vol 357
◽
pp. 838-844
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Keyword(s):
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2020 ◽
Vol 10
(1)
◽
pp. 97-103
◽
Keyword(s):