Compared Study of a Quenched Blue Phase by Direct Transmission Electron and Atomic Force Microscopy

Author(s):  
HÉLÈNe Dumoulin ◽  
Pawel Pieranski ◽  
HervÉ Delacroix ◽  
Inge Erk ◽  
Jean-Marc Gilli ◽  
...  
1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.


1997 ◽  
Vol 36 (4) ◽  
pp. 41-48 ◽  
Author(s):  
A. Cornelissen ◽  
M. G. Burnett ◽  
R. D. McCall ◽  
D. T. Goddard

This paper concerns the imaging of hydrous floc particles by Light Microscopy (LM), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Atomic Force Microscopy (AFM). The use of a microscope technique means that visual structural information is obtained, in contrast with other techniques measuring particle characteristics. It was found that when a preparation technique was used that involves cryogenic freezing of the sample, before observation in the SEM, larger (1-100 μm) floc particles could be imaged without the loss of structural information normally caused by drying the sample. Damage caused by drying was not apparent with the TEM technique used. It was shown that the various microscope techniques produced compatible results, together covering a wide size range (10 nm-5mm). This indicates that major artefact formation due to sample preparation is unlikely. It was furthermore shown that when a micro-scale continuous flow system was used the reproducibility of the floc structure observed increased.


1997 ◽  
Vol 3 (3) ◽  
pp. 203-213 ◽  
Author(s):  
J.A. DeRose ◽  
J.-P. Revel

Abstract: We have developed a method for the examination of atomic force microscopy (scanning force microscopy) tips using a high-resolution transmission electron microscope (TEM). The tips can be imaged in a nondestructive way, enabling one to observe the shape of an atomic force microscope probe in the vicinity of the apex with high resolution. We have obtained images of atomic force microscopy probes with a resolution on the order of 1 nm. The tips can be imaged repeatedly, so one can examine tips before and after use. We have found that the tip can become blunted with use, the rate of wear depending upon the sample and tip materials and the scanning conditions. We have also found that the tips easily accrue contamination. We have studied both commercially produced tips, as well as tips grown by electron beam deposition. Direct imaging in the TEM should prove useful for image deconvolution methods because one does not have to make any assumptions concerning the general shape of the tip profile.


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