scholarly journals Reliability of non-destructive sonic tomography for detection of defects in old Zelkova serrata (Thunb.) Makino trees

Author(s):  
Jiwon Son ◽  
Sihyun Kim ◽  
Jinho Shin ◽  
Gwanggyu Lee ◽  
Han Kim
2018 ◽  
Vol 8 (12) ◽  
pp. 2378 ◽  
Author(s):  
Houman Mahal ◽  
Kai Yang ◽  
Asoke Nandi

In the past decade, guided-wave testing has attracted the attention of the non-destructive testing industry for pipeline inspections. This technology enables the long-range assessment of pipelines’ integrity, which significantly reduces the expenditure of testing in terms of cost and time. Guided-wave testing collars consist of several linearly placed arrays of transducers around the circumference of the pipe, which are called rings, and can generate unidirectional axisymmetric elastic waves. The current propagation routine of the device generates a single time-domain signal by doing a phase-delayed summation of each array element. The segments where the energy of the signal is above the local noise region are reported as anomalies by the inspectors. Nonetheless, the main goal of guided-wave inspection is the detection of axisymmetric waves generated by the features within the pipes. In this paper, instead of processing a single signal obtained from the general propagation routine, we propose to process signals that are directly obtained from all of the array elements. We designed an axisymmetric wave detection algorithm, which is validated by laboratory trials on real-pipe data with two defects on different locations with varying cross-sectional area (CSA) sizes of 2% and 3% for the first defect, and 4% and 5% for the second defect. The results enabled the detection of defects with low signal-to-noise ratios (SNR), which were almost buried in the noise level. These results are reported with regard to the three different developed methods with varying excitation frequencies of 30 kHz, 34 kHz, and 37 kHz. The tests demonstrated the advantage of using the information received from all of the elements rather than a single signal.


2007 ◽  
Vol 40 (4) ◽  
pp. 337-346 ◽  
Author(s):  
Hasanzadeh P.R. Reza ◽  
A.H. Rezaie ◽  
S.H.H. Sadeghi ◽  
M.H. Moradi ◽  
M. Ahmadi

Author(s):  
Selim Elhadj ◽  
Jake Yoo ◽  
Ted Laurence ◽  
Qinghui Shao ◽  
Sonny Ly ◽  
...  

Author(s):  
J W Steeds

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.


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