The Extent of Ionic Binding in Cadmium Telluride

1959 ◽  
Vol 74 (4) ◽  
pp. 490-491 ◽  
Author(s):  
T S Moss
Keyword(s):  
Cadmium Telluride ◽  
Ionic Binding

Preparation of Thin Cadmium Telluride Samples for Electron Microscope Studies

1974 ◽  
Vol 32 ◽  
pp. 548-549
Author(s):  
T. J. Magee ◽  
J. Peng ◽  
J. Bean
Keyword(s):  
Electron Microscope ◽  
Sulfuric Acid ◽  
Solid State ◽  
Sample Preparation ◽  
Cadmium Telluride ◽  
Potassium Dichromate ◽  
Optical Components ◽  
The Past ◽  
Solid State Devices

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.

The morphologies and electrical properties of indium contacts on (100) cadmium telluride surfaces

1992 ◽  
Vol 50 (2) ◽  
pp. 1422-1423
Author(s):  
A.M. Letsoalo ◽  
M.E. Lee ◽  
E.O. de Neijs
Keyword(s):  
Electrical Properties ◽  
Cadmium Telluride ◽  
Methanol Solution ◽  
Electrical Characteristics ◽  
Metal Contacts ◽  
Deposition Technique ◽  
Interfacial Layers ◽  
Semiconductor Contacts ◽  
Grown Single Crystal ◽  
Diamond Abrasive

Semiconductor devices require metal contacts for efficient collection of electrical charge. The physics of these metal/semiconductor contacts assumes perfect, abrupt and continuous interfaces between the layers. However, in practice these layers are neither continuous nor abrupt due to poor nucleation conditions and the formation of interfacial layers. The effects of layer thickness, deposition rate and substrate stoichiometry have been previously reported. In this work we will compare the effects of a single deposition technique and multiple depositions on the morphology of indium layers grown on (100) CdTe substrates. The electrical characteristics and specific resistivities of the indium contacts were measured, and their relationships with indium layer morphologies were established.Semi-insulating (100) CdTe samples were cut from Bridgman grown single crystal ingots. The surface of the as-cut slices were mechanically polished using 5μm, 3μm, 1μm and 0,25μm diamond abrasive respectively. This was followed by two minutes immersion in a 5% bromine-methanol solution.

Localization of Y Luminescence at Glide Dislocations in Cadmium Telluride

1997 ◽  
Vol 7 (7) ◽  
pp. 1505-1514 ◽  
Author(s):  
S. Hildebrandt ◽  
H. Uniewski ◽  
J. Schreiber ◽  
H. S. Leipner
Keyword(s):  
Cadmium Telluride

DEFECTS IN CADMIUM TELLURIDE AS STUDIED BY SEM/EBIC

1983 ◽  
Vol 44 (C4) ◽  
pp. C4-297-C4-304 ◽  
Author(s):  
B. Sieber ◽  
M. Dupuy
Keyword(s):  
Cadmium Telluride

Dispersion Parameters of Thin Cadmium Telluride Films at Different Thicknesses

2012 ◽  
Vol 2 (3) ◽  
pp. 368-370
Author(s):  
Rasha A Abdullah ◽  
◽  
Nada M Saeed ◽  
Hussain Kh. Al Khalid ◽  
Mohammed A Razooqi
Keyword(s):  
Cadmium Telluride ◽  
Dispersion Parameters

The effect of etchants on surface of CdTe single crystal

2016 ◽  
Vol 12 (1) ◽  
pp. 4145-4147
Author(s):  
S. Javad Mousavi
Keyword(s):  
Single Crystal ◽  
Cadmium Telluride ◽  
Etch Pits ◽  
Cdte Single Crystal ◽  
Sublimation Method ◽  
Crystallographic Defect

Cadmium telluride crystals (CdTe) have been grown by the sublimation method. The crystal polarity of the CdTe with the zincblend structure has been studied. Two different crystallographic defect and etch pits are revealed on the (111) Cd and  Te surfaces by different etchant.

scholarly journals Characterization of a Pixelated Cadmium Telluride Detector System Using a Polychromatic X-Ray Source and Gold Nanoparticle-Loaded Phantoms for Benchtop X-Ray Fluorescence Imaging

IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 49912-49919
Author(s):  
Sandun Jayarathna ◽  
Md Foiez Ahmed ◽  
Liam O'ryan ◽  
Hem Moktan ◽  
Yonggang Cui ◽  
...  
Keyword(s):  
Gold Nanoparticle ◽  
Fluorescence Imaging ◽  
Cadmium Telluride ◽  
Detector System ◽  
X Ray
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